Lead oxide (PbO) is one of the most promising materials for application in direct conversion medical imaging X-ray detectors. Despite its high potential, conventional polycrystalline PbO layers deposited with the basic thermal evaporation method are not yet mature for practical use in x-ray imaging; indeed, they are highly porous, unstable at ambient conditions, and sub-stoichiometric. In order to combat the above issues with PbO, we advance the basic evaporation process with simultaneous energetic ion bombardment of the growing film. We show that tuning the ion-assisted thermal deposition not only solves the structural problems of poly-PbO, but also enables the growth of a new non-crystalline polymorphic form of the material-amorphous PbO (a-PbO). In contrast to poly-PbO, novel a-PbO layers grown by ion-assisted thermal deposition are stable at ambient conditions. Structural and morphological analysis confirms that a-PbO is stoichiometric and free of detectable voids, which suggests higher bulk X-ray stopping power than porous poly-PbO.