Silicon dioxide by Ag Lα, hard x-ray photoelectron spectroscopy

Abstract

Silicon dioxide powder was characterized by hard x-ray photoelectron spectroscopy (HAXPES) with an Ag Lα (2984.2 eV) excitation source. The sample was fixed to a stainless-steel sample holder with copper double-sided adhesive tape. Survey spectrum, C 1s, O 1s, Si 1s, Si KLL, Si 2s, and Si 2p core levels spectra were acquired.