Silicon nanoparticles: a new and enhanced operational material for nitrophenol sensing

Enhanced Lithium Storage in Micro-Si-Based Anode Materials through Low-Temperature Interface Engineering with an Ultrathin Phenolic Interlayer

“…These angles correspond to the (111), (220), (311), (400), (331), and (422) crystallographic planes of cubic-phase Si, respectively (JCPSD card no. 27-1402) . This finding indicates that the crystalline phase of the pure Si remains intact after the thermolytic grafting process at 360 °C.…”

“…27-1402). 31 This finding indicates that the crystalline phase of the pure Si remains intact after the thermolytic grafting process at 360 °C. Notably, m-GPSi did not display discernible C peaks, likely owing to the amorphous nature of the grafted C species.…”

“…To fortify the physicochemical integrity of Si-based anodes, it is essential to introduce durable covalent bonds between the C matrices and the Si interface. Among the various C matrices explored, phenolic carbon stands out because of its ability to store significant Li + ions per unit mass, resulting in high specific capacities and commendable rate capabilities. − …”

Highly sensitive and selective detection of glutathione using ultrasonic aided synthesis of graphene quantum dots embedded over amine-functionalized silica nanoparticles

“…Comparing the I D /I G intensity ratios of pristine GQDs (1.07) with GQDs-SiNPs (0.70), a decrease is observed after embedding GQDs on the surface of SiNPs. Such changes could be due to the variation in the size of the in-plane sp 2 region that is increased notably, while the intensity of the D-band decreases as the degree of carbonization increases [53] . In addition, contrasting the FT-IR spectra ( Fig.…”

Background free in vivo29Si MR imaging with hyperpolarized PEGylated silicon nanoparticles

“…† For both samples, five peaks were observed at 2θ = 28.3°〈111〉, 47.1°〈220〉, 56.2°〈311〉, 69.3°〈400〉, and 76.4°〈331〉, respectively, exhibiting the presence of a silicon crystalline phase in the sample. 31 PEGylation did not markedly alter the crystallinity of the material, and no impurity-related peaks were detected in either sample, indicating high purity and good crystallinity. FT-IR analysis was performed to characterize the functional groups, identifying PEG-derived aliphatic C-H stretching (2,886 cm −1 ) and C-H bending (1,442 cm −1 and 1,373 cm −1 ) in the PEG-modified silicon samples (Fig.…”