2011
DOI: 10.1109/led.2011.2106758
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Silicon Nanowire All-Around Gate MOSFETs Built on a Bulk Substrate by All Plasma-Etching Routes

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Cited by 39 publications
(13 citation statements)
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“…The tetraethyl orthosilicate (TEOS) with thickness of 70 nm is employed for the device isolation as STI does in conventional CMOS process. More detailed process was explained in previously reported work [8]. A 2 nm-thick tunneling oxide is thermally grown on nanowire, and then a 2 nm-thick trapping layer of SiN and a 2 nm-thick blocking oxide were deposited using the LPCVD process.…”
Section: Device Fabrication and Measurementmentioning
confidence: 99%
“…The tetraethyl orthosilicate (TEOS) with thickness of 70 nm is employed for the device isolation as STI does in conventional CMOS process. More detailed process was explained in previously reported work [8]. A 2 nm-thick tunneling oxide is thermally grown on nanowire, and then a 2 nm-thick trapping layer of SiN and a 2 nm-thick blocking oxide were deposited using the LPCVD process.…”
Section: Device Fabrication and Measurementmentioning
confidence: 99%
“…The CF 4 -based polymer passivated the exposed Si surface, which protects the SiNW from being etched during the subsequent SF 6 plasma etching. The combined anisotropic and isotropic etching implemented in the Bosch process separated the SiNW from the bulk Si substrate [17] (step 3). A suspended SiNW with a width of 50 nm and a height of 100 nm was thus created, as shown in the inset of Fig.…”
Section: Fabrication Of a Dual-gate Fet Sensormentioning
confidence: 99%
“…A nitride hard mask was initially deposited as a stopping layer of CMP. The SiNW is fabricated by a one-route deep RIE process (Bosch process [6]). Independent gates are formed by n + poly-Si deposition and CMP.…”
Section: Dna Sensingmentioning
confidence: 99%
“…Silicon nitride was deposited as a stopping layer for the subsequent chemical-mechanical polishing (CMP). A SiNW was formed by means of the photo-resist ashing and deep RIE procedure known as the Bosch process [6]. As shown in Fig.…”
mentioning
confidence: 99%