Silicon nitride granule friction measurements with an atomic force microscope: effect of humidity and binder concentration

Meurk, Anders; Yanez, Joseph A.; Bergström, Lennart

doi:10.1016/s0032-5910(01)00260-1

Cited by 16 publications

(11 citation statements)

References 24 publications

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“…As a model for salt aerosol retention at surfaces, interaction of a salt crystal colloid probe and a metal oxide surface was studied, taking into account probe dimensions, surface chemistry, and relative humidity [607]. Meurk et al [608] found an increase of adhesion for silicon nitride granules from spray drying with content of polyethylene glycol (PEG) binder and humidity that leads to a softening of the PEG binder. Adhesion between two gypsum (CaSO 4 Á2H 2 O) crystals in air and ionic solutions as a model system for solidification of plaster was studied by Finot et al [176,609,610].…”

Section: Particle Adhesionmentioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,245

2,949

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Section: Particle Adhesionmentioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,245

2,949

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“…Despite the early recognition of the potential of the AFM for friction force measurement [50,51] it was some time before this application became routine for quantifying shear or frictional forces between a tip [51][52][53][54][55], or a particle [56][57][58][59], and a sample. As with normal forces, friction can be measured in liquid [56,58,60], air/vapor [57,61,62], or vacuum [42].…”

Section: Frictional Forcesmentioning

confidence: 99%

Atomic force microscopy and direct surface force measurements (IUPAC Technical Report)

Ralston

Larson

Rutland³

et al. 2005

Pure and Applied Chemistry

145

106

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Republication or reproduction of this report or its storage and/or dissemination by electronic means is permitted without the need for formal IUPAC permission on condition that an acknowledgmentAbstract: The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case, atomic) topographical analysis, applicable to both conducting and nonconducting surfaces. The basic imaging principle is very simple: a sample attached to a piezoelectric positioner is rastered beneath a sharp tip attached to a sensitive cantilever spring. Undulations in the surface lead to deflection of the spring, which is monitored optically. Usually, a feedback loop is employed, which holds the spring deflection constant, and the corresponding movement of the piezoelectric positioner thus generates the image. From this it can be seen that the scanning AFM has all the attributes necessary for the determination of surface and adhesion forces; a sensitive spring to determine the force, a piezoelectric crystal to alter the separation of the tip and surface, which if sufficiently well-calibrated also allows the relative separation of the tip and surface to be calculated. One can routinely quantify both the net surface force (and its separation dependence) as the probe approaches the sample, and any adhesion (pulloff) force on retraction. Interactions in relevant or practical systems may be studied, and, in such cases, a distinct advantage of the AFM technique is that a particle of interest can be attached to the end of the cantilever and the interaction with a sample of choice can be studied, a method often referred to as colloid probe microscopy. The AFM, or, more correctly, the scanning probe microscope, can thus be used to measure surface and frictional forces, the two foci of this article. There have been a wealth of force and friction measurements performed between an AFM tip and a surface, and many of the calibration and analysis issues are identical to those necessary for colloid probe work. We emphasize that this article confines itself primarily to elements of colloid probe measurement using the AFM.

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“…The left side of the figure illustrates FFM studies using a sharp tip, either silica, [58][59][60][61][62][63][64][65][66][67][68][69][70] or silicon nitride. 32,42,68, On the right side of the figure are shown the FFM studies using a colloidal probe made from: collagen; 96 latex; 97 polyethylene (PE); 25,28,45,98 polyethylene glycol (PEG); 99 poly(methyl methacrylate) PMMA; 26,27,95,100 polystyrene (PS); 33,71,101 cellulose; 31,[102][103][104][105][106][107][108][109] and silica. 35,36,98,[110][111][112][113][114][115][116][117] The volume of the symbol corresponds to the number of studies using the specific syste...…”

Section: Effect Of Surface Interactions On Nanoscale Frictionmentioning

confidence: 99%

Probing the frictional properties of soft materials at the nanoscale

et al. 2020

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Silicon nitride granule friction measurements with an atomic force microscope: effect of humidity and binder concentration

Cited by 16 publications

References 24 publications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Atomic force microscopy and direct surface force measurements (IUPAC Technical Report)

Probing the frictional properties of soft materials at the nanoscale

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