2008
DOI: 10.1063/1.2963707
|View full text |Cite
|
Sign up to set email alerts
|

Silicon surface passivation by atomic layer deposited Al2O3

Abstract: DOI to the publisher's website. • The final author version and the galley proof are versions of the publication after peer review. • The final published version features the final layout of the paper including the volume, issue and page numbers. Link to publication General rights Copyright and moral rights for the publications made accessible in the public portal are retained by the authors and/or other copyright owners and it is a condition of accessing publications that users recognise and abide by the legal… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

19
311
0
1

Year Published

2009
2009
2022
2022

Publication Types

Select...
4
3

Relationship

1
6

Authors

Journals

citations
Cited by 446 publications
(331 citation statements)
references
References 52 publications
19
311
0
1
Order By: Relevance
“…1,2 The field effect passivation associated with the negative fixed charges near the Al 2 O 3 / c-Si interface, 2 proved to be especially beneficial for the passivation of highly doped p-type c-Si, with Al 2 O 3 even outperforming thermally grown SiO 2 . 3 The application of a thin Al 2 O 3 film as a front passivation layer on a B-doped emitter has recently led to efficiencies as high as 23.2% for n-type c-Si solar cells.…”
mentioning
confidence: 99%
“…1,2 The field effect passivation associated with the negative fixed charges near the Al 2 O 3 / c-Si interface, 2 proved to be especially beneficial for the passivation of highly doped p-type c-Si, with Al 2 O 3 even outperforming thermally grown SiO 2 . 3 The application of a thin Al 2 O 3 film as a front passivation layer on a B-doped emitter has recently led to efficiencies as high as 23.2% for n-type c-Si solar cells.…”
mentioning
confidence: 99%
“…This trend is observed in all the samples. Therefore, optimized sintering time for the best passivation is 105 s. It is to be noted that in most of the publications, 1,[7][8][9][10]27 annealing is done for longer time durations (10-30 min) and there is hardly any publication for shorter t anl . Table 2 summarizes the measured minority carrier lifetime and corresponding estimated SRV values with films of different thicknesses.…”
Section: Minority Carrier Lifetimementioning
confidence: 99%
“…2 Passivation reduces surface recombination losses by two ways, i.e., chemical passivation (reduction of the density of electronic surface states) and field effect passivation (the presence of fixed charges in the dielectric layer over the silicon surface that reduces the carrier density underneath the interface of the two). 1,[7][8][9][10] A well passivated surface reduces the recombination of photo-generated carriers in the vicinity of the two surfaces and improves the cell performance parameters. [11][12][13][14] Thermally grown silicon oxide (SiO 2 ), silicon nitride (a-SiN x :H) and amorphous silicon (a-Si:H) are commonly used for surface passivation of c-Si solar cells.…”
Section: Introductionmentioning
confidence: 99%
See 2 more Smart Citations