2017
DOI: 10.1063/1.5000858
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Silver photodiffusion into Ge-rich amorphous germanium sulfide—neutron reflectivity study

Abstract: Silver diffuses into chalcogenide films upon light exposure, and the kinetics of photodiffusion has been a subject of various investigations because of the difficulties in the in situ determination of the time-dependent Ag reaction and diffusion development in the chalcogenide layers. In this paper, we report the results of time-resolved neutron reflectivity measurement of Ag/Ge 40 S 60 /Si substrates under light exposure to clarify the kinetics of Ag photodiffusion into Ge-rich Ge chalcogenides. It reveals th… Show more

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Cited by 9 publications
(9 citation statements)
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“…As for the peak of Ag (111) at 38.1°, its intensity decreases with increasing the chalcogenide layer thickness from 450 to 775 Å. This is consistent with our previous experiment on the chalcogenide thickness dependence and with the intercalation model proposed by Kluge, suggesting that more silver dissolves into the thicker chalcogenide layer. According to the model, intercalation of Ag occurs by the creation of Ch − Ag + bonds (Ch: chalcogen atom) at the site of the Ch‐Ch or Ge‐Ch bond.…”
Section: Resultssupporting
confidence: 91%
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“…As for the peak of Ag (111) at 38.1°, its intensity decreases with increasing the chalcogenide layer thickness from 450 to 775 Å. This is consistent with our previous experiment on the chalcogenide thickness dependence and with the intercalation model proposed by Kluge, suggesting that more silver dissolves into the thicker chalcogenide layer. According to the model, intercalation of Ag occurs by the creation of Ch − Ag + bonds (Ch: chalcogen atom) at the site of the Ch‐Ch or Ge‐Ch bond.…”
Section: Resultssupporting
confidence: 91%
“…In Ge 33 S 67 /Ag/Si substrate and Ag/Ge 40 S 60 /Si substrate, Ag ions dissolve into the chalcogenide layer and immediately diffuse all over the layer upon the light exposure, without forming a metastable layer between the Ag layer and the chalcogenide layer . Also, the reaction rate shows anomalous chalcogenide thickness dependence, which is considered to occur due to a diffusion‐driven accelerating factor in the reaction rate . The chalcogenide thickness dependence on the reaction rate was observed in Ge 33 S 67 /Ag/Si substrate and Ag/Ge 40 S 60 /Si substrate.…”
Section: Introductionmentioning
confidence: 99%
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“…Фотостимулированное взаимодействие в тонкопленочной структуре ХС−Ag является сложным явлением, включающим фотоэлектрические процессы, фотостимулированный массоперенос, химическое взаимодействие диффундирующих компонентов [10,11]. Эта сложность процесса обусловила и разную терминологию, которая применялась в литературе для данного явления, в частности, фотолегирование (photodoping) [10,12], фотодиффузия [11,13], фоторастворение [14]. Каждый из этих терминов отражает определенные особенности процесса и все они могут использоваться как синонимы.…”
Section: Introductionunclassified