1999
DOI: 10.1016/s0921-5107(98)00282-7
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Similarities in the electrical properties of transition metal–hydrogen complexes in silicon

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Cited by 48 publications
(33 citation statements)
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“…The same trend is seen for Pd-and Ni-H complexes. It is interesting to note that Cu in Ge exhibits a similar shift with hydrogen [35], the Cu-H 3 complex is electrically passive, very similar to our results on Cu-, Ag-and Au-H complexes in Si [9,32]. Calculations by Jones et al confirm the number and level position of the energy levels for a number of our TM-H complexes [36,37].…”
supporting
confidence: 89%
See 1 more Smart Citation
“…The same trend is seen for Pd-and Ni-H complexes. It is interesting to note that Cu in Ge exhibits a similar shift with hydrogen [35], the Cu-H 3 complex is electrically passive, very similar to our results on Cu-, Ag-and Au-H complexes in Si [9,32]. Calculations by Jones et al confirm the number and level position of the energy levels for a number of our TM-H complexes [36,37].…”
supporting
confidence: 89%
“…In particular, in low-cost solar-cells hydrogen was thought to eliminate recombination centers. However, in Si most of the detrimental transition metals form efficiently with hydrogen new electrical active defects [9]. Examples for the interaction of transition metals with hydrogen will be presented.…”
mentioning
confidence: 98%
“…The TM-H complexes with Ti, Co, Ag, Pt, Pd, Ni, and Cu have been detected primarily by deep level transient spectroscopy (DLTS) analyses. [28][29][30] In some cases, equilibrium structures for TM-H complexes have been calculated. 31 Interestingly, the DLTS data do not verify that the complexes are electrically inactive.…”
Section: Hydrogen Interactions With Impuritiesmentioning
confidence: 99%
“…The amount of hydrogen introduced is very low and is confined to the surface region. Much of the hydrogen is bound to P donors or B acceptors present in the material but annealing under a reverse bias (RBA) has the effect of driving the hydrogen deeper into the sample [164,165,166,167,168,169]. This method is particularly useful for a study of hydrogen related defects which dissociate around room temperature.…”
Section: Wet Etchingmentioning
confidence: 99%
“…Hydrogenation of substitutional TM centres can shift the position of the deep levels due to the impurity [164,165,166,167,168,169,170,171,172,173,174].…”
Section: Transition Metal-hydrogen Defectsmentioning
confidence: 99%