2017
DOI: 10.22180/na198
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Simple and Low-temperature Growth of High Thermal Performance W-Ti Co-Doped VO2 Films on a Scale Wafer

Abstract: There has been a long-standing challenge in promoting the fundamental research frontier in oxide electronics to commercial devices applications. Wafer-scale growth of high-performance oxide thin films is demanded urgently. In this paper, we successfully fabricated W-Ti co-doped VO 2 films with a pretty high coefficient of resistance (TCR: 7.09%/°C) and without hysteresis during heating and cooling processing. A scalable growth on 4 inch SiN x /Si wafer was obtained with excellent resistance uniformity (1σ = 2.… Show more

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Cited by 3 publications
(1 citation statement)
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“…Many methods have been adopted to synthesize high-quality VO 2 films, however, the growth of wafer-scale, high-quality VO 2 films with excellent phase transition property is still a challenge. To date, 2-inch epitaxial VO 2 film grown by molecular beam epitaxy was reported 44 , and preparation of large-scale VO 2 films by electron-beam evaporation 45 , thermal oxidation 46 , sol-gel method 47 , and sputtering 48 has also been reported. Nevertheless, the crystalline quality of the VO 2 film might be compromised in some preparation processes, and the growth method should be selected based on the detailed requirements on sample scale and crystalline quality in the applications.…”
Section: Resultsmentioning
confidence: 99%
“…Many methods have been adopted to synthesize high-quality VO 2 films, however, the growth of wafer-scale, high-quality VO 2 films with excellent phase transition property is still a challenge. To date, 2-inch epitaxial VO 2 film grown by molecular beam epitaxy was reported 44 , and preparation of large-scale VO 2 films by electron-beam evaporation 45 , thermal oxidation 46 , sol-gel method 47 , and sputtering 48 has also been reported. Nevertheless, the crystalline quality of the VO 2 film might be compromised in some preparation processes, and the growth method should be selected based on the detailed requirements on sample scale and crystalline quality in the applications.…”
Section: Resultsmentioning
confidence: 99%