In the p‐type quasi‐neutral and heavily doped emitter region of silicon devices at room temperature, with the aid of our accurate empirical models for the apparent band‐gap narrowing and minority‐electron lifetime, a simple accurate theory of minority‐electron (emitter) saturation current density JEO, and effective minority‐electron transit time, which are expressed as functions of the surface acceptor density Ns, the electron surface recombination velocity S, and the emitter width W, is derived and discussed. It is found that, under transparent emitter region condition, our theoretical values of JEO(Ns) for S = ∞ and 0.19 μm ≦ W ≦ 0.25 μm are in good agreement with the corresponding ones measured by Cuevas et al., with a precision of the order of 22%.