1984
DOI: 10.1063/1.333898
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Simple general analytical solution to the minority carrier transport in heavily doped semiconductors

Abstract: A rigorous analytical evaluation of minority carrier current in a heavily doped region (such as emitter) of a semiconductor device is presented that includes position-dependent band-gap narrowing, position-dependent mobility, and position-dependent lifetime. In addition, the analysis takes into account the possible finite surface recombination velocity.

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Cited by 34 publications
(10 citation statements)
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“…Here, the empirical parameter y 0 is determined such that the error of this approximated analytical solution is minimized. As a result, with the use of CN s instead of the constant C S , being N s -independent [4], Selvakumar's approach [4] can now be performed. Then, from (8), (10) and (11), we obtain for u r y [or J S y an analytical solution we denote by the zeroth-order approximated solution as that given in [12] u rY 0 y sinh Py h cosh Pyasinh P1 h cosh P1 Y 13…”
Section: Zeroth-order Approximated Solutionmentioning
confidence: 99%
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“…Here, the empirical parameter y 0 is determined such that the error of this approximated analytical solution is minimized. As a result, with the use of CN s instead of the constant C S , being N s -independent [4], Selvakumar's approach [4] can now be performed. Then, from (8), (10) and (11), we obtain for u r y [or J S y an analytical solution we denote by the zeroth-order approximated solution as that given in [12] u rY 0 y sinh Py h cosh Pyasinh P1 h cosh P1 Y 13…”
Section: Zeroth-order Approximated Solutionmentioning
confidence: 99%
“…In addition, this constant C S is an empirical parameter, determined by a particular functional dependence of the minority-carrier lifetime tN. This approach [4] or the similar one [7,10,12] may be questionable because CN is a function of y and N s .…”
Section: Introductionmentioning
confidence: 99%
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