2019
DOI: 10.1364/ol.44.002709
|View full text |Cite
|
Sign up to set email alerts
|

Simple phase noise measurement scheme for cavity-stabilized laser systems

Abstract: We describe a simple method for measuring the residual fast phase noise of a cavity-stabilized laser using the cavity as a reference. The method is based on generating a beat note between the laser output and the strongly filtered light transmitted through the cavity. The beat note can be directly analyzed without requiring further calibration of system parameters. We apply the method to measure the residual phase noise of an external-cavity diode laser (ECDL) locked to a reference cavity and compare the resul… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
6
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
7
1

Relationship

1
7

Authors

Journals

citations
Cited by 18 publications
(6 citation statements)
references
References 26 publications
0
6
0
Order By: Relevance
“…These lasers require stabilization, if no atomic reference is available at room temperature [8], to sophisticated and expensive reference cavities, with ultra-high stability and finesse, to reduce the free-running linewidth from hundreds of kHz to Hz [9]. In this case, a narrow full-width at half maximum (FWHM) linewidth may still not be indicative of sufficient spectral purity, given the broad phase noise 'pedestal' typical of high gain, edge-emitting semiconductor lasers, which have significant fast frequency noise [10]. Further, depending on the required emission wavelength, these systems often do not provide sufficient optical power.…”
Section: Introductionmentioning
confidence: 99%
“…These lasers require stabilization, if no atomic reference is available at room temperature [8], to sophisticated and expensive reference cavities, with ultra-high stability and finesse, to reduce the free-running linewidth from hundreds of kHz to Hz [9]. In this case, a narrow full-width at half maximum (FWHM) linewidth may still not be indicative of sufficient spectral purity, given the broad phase noise 'pedestal' typical of high gain, edge-emitting semiconductor lasers, which have significant fast frequency noise [10]. Further, depending on the required emission wavelength, these systems often do not provide sufficient optical power.…”
Section: Introductionmentioning
confidence: 99%
“…The excitation dynamics of the 1 S-2 S transition in He + depends on many parameters. These include the power of the XUV radiation that drives the transition and that can contribute to ionization from the 2 S state, the focal size, the reduction of the carrier power due to residual phase noise [50], and perturbations of the ions by the trapping RF field [18]. Some of these contributions are difficult to estimate accurately.…”
Section: Discussionmentioning
confidence: 99%
“…We achieve this by tightly locking one infrared comb mode to a continuous wave (CW) reference laser at 1033 nm, corresponding to 1/17 of the 1 S-2 S two-photon transition frequency. The reference CW laser is stabilized to an ultra-stable reference cavity [50]. In addition, the phase noise introduced by path length fluctuations along the setup is measured by heterodyne beat detection with the same reference laser, right before the enhancement resonator for HHG.…”
Section: Laser Setupmentioning
confidence: 99%
See 1 more Smart Citation
“…From this, the phase noise power spectral density L(ω) can be determined as described in Ref. [36], see Fig. 4.…”
Section: Stirap Setupmentioning
confidence: 99%