2002
DOI: 10.1109/22.982236
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Simple technique for measuring source reflection coefficient while characterizing active devices

Abstract: The measurement of the source reflection coefficient is fundamental for noise, as well as large-signal testing of microwave active devices. This paper describes a simple yet rigorous technique for fast and accurate determination of a source reflection coefficient when a load-source pull test set is used. The solution consists in measuring the waves at the device-under-test reference plane under two different bias conditions. We have proven that these measurements give enough information to compute the source r… Show more

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Cited by 7 publications
(3 citation statements)
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“…By implementing this method and applying few basics signal flow graph rules the evaluation of complex equations can be greatly simplified. We have used this method to solve and simplify these equations using signal flow graph [14,15]. In general S 11 for DUC using VNA may be given by equation (4), where a 1 is incident wave and b 1 as reflected wave.…”
Section: Measurement Proceduresmentioning
confidence: 99%
“…By implementing this method and applying few basics signal flow graph rules the evaluation of complex equations can be greatly simplified. We have used this method to solve and simplify these equations using signal flow graph [14,15]. In general S 11 for DUC using VNA may be given by equation (4), where a 1 is incident wave and b 1 as reflected wave.…”
Section: Measurement Proceduresmentioning
confidence: 99%
“…5) Γ S measurement mode. To perform real time Γ S measurements according to the method described in [7] SWT2 is set to excite the port b s of the input sampling head. The RF signal originates from the VNA and the receiver B is used.…”
Section: ) Small Signal Calibration and Measurement Modementioning
confidence: 99%
“…In [4], a simple yet fairly accurate load-source pull test scheme is proposed to measure the reflection coefficient of a device.…”
Section: Introductionmentioning
confidence: 99%