Simple tool of analysis for cycle time reduction

Sada, Tatsunori; Yuen, Robert; Ichikawa, Masaru; Yamada, Masahiko; Kabata, Kenji

doi:10.1109/issm.2001.962919

Cited by 3 publications

(1 citation statement)

References 2 publications

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“…There are numerous methods, tools and techniques developed to tackle CT related problems. A few of them are listed below: Sada et al [11], used a simple spreadsheet technique to decrease CT in a semiconductor fabrication plant. The spread sheet is used to compare the theoretical CT with actual CT for each process involved in the fabrication.…”

Section: Literature Reviewmentioning

confidence: 99%

Manufacturing Enhancement through Reduction of Cycle Time using Time-Study Statistical Techniques in Automotive Industry

Mohammed

Ahmad

2019

2019 IEEE International Conference on Industrial Cyber Physical Systems (ICPS)

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Section: Literature Reviewmentioning

confidence: 99%

Manufacturing Enhancement through Reduction of Cycle Time using Time-Study Statistical Techniques in Automotive Industry

Mohammed

Ahmad

2019

2019 IEEE International Conference on Industrial Cyber Physical Systems (ICPS)

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Virtual mini-line management system for new product pilot run control

Wu¹,

Lo²,

Pan³

2007

2007 International Symposium on Semiconductor Manufacturing

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This paper purpose is to improve the turn rate of "pilot lot" to shorten new product development time. These lots belong to the R&D department. We call these lots as R&D lots. In order to push these lots shorter than production lots, we construct a virtual mini-line in already existing production line to satisfy production output requirement for manufacture department and new product pilot run requirement for R&D department. After the miniline system released, we got good results. Our Technology development cycle time in super hot lot/hot lot improved 10.6% and 11.9% respectively than before.

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The tool efficiency monitoring system creation of furnace area in semiconductor manufacturing

Chiou¹,

Wang²,

Chang³

et al.

Semiconductor Manufacturing Technology Workshop, 2002

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This paper describes a framework of e,Qiency monitoring system of fumace area in semiconductor manufacturing factory. One of the primary ol,jectives was to review the eflciency of operator In particular: the system focused on finding the effective qpciency index. Secondary objectives were to provide Wifer per Hour (WPH) data, especially for the newly developed technoloo, and to prepare U protorype for Out of Control Abnormal Procedure (OCAP) warming system. Hth this approach, we establish an effective review system for operator; therefore, improve I O to IS% capaciQ of our key furnace tubes. Now a simple warming system of operator efficiency is ready and starts to install to the otherproduction area. WTRODUCHONFumace tubes were bottlenecks of our FAB and they are killers of cycle time. Usually, each batch, with 1 to 6 lots of wafers loaded and it takes a long time to process. The batch process time of the same recipe, from the first wafer load in to the last piece mswe out, in different batches of a fumace tube are varied. The experienced supervisor could tell you that it must come from the efficiency lose of operators. Yes, of coiirse, but does it always true? Efficiency of operator is ,:qual to actual output I standard output, but, in real world, it becomes ambiguous when batch size gets irivalved! Operators should not responsible for the batch size, but it is not easy to tell their performance from the production logs.

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Simple tool of analysis for cycle time reduction

Cited by 3 publications

References 2 publications

Manufacturing Enhancement through Reduction of Cycle Time using Time-Study Statistical Techniques in Automotive Industry

Manufacturing Enhancement through Reduction of Cycle Time using Time-Study Statistical Techniques in Automotive Industry

Virtual mini-line management system for new product pilot run control

The tool efficiency monitoring system creation of furnace area in semiconductor manufacturing

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