Simplified electrical test procedures for components of isolated LPS

Beierl, Ottmar; Brocke, Ralph; Rother, Claudia

doi:10.1109/iclp.2010.7845839

2010 30th International Conference on Lightning Protection (ICLP) 2010

DOI: 10.1109/iclp.2010.7845839

|View full text |Cite

Simplified electrical test procedures for components of isolated LPS

Ottmar Beierl

Ralph Brocke²,

Claudia Rother³

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2012

2023

Publication Types

Select...

Other5

Relationship

Self Cite0

Independent5

Authors

Journals

Cited by 7 publications

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

Evaluation of the Electric Stress on an Insulating Down-Conductor Caused by Lightning Strikes through ATP-EMTP Simulations

Samaras,

Staikos,

Datsios

et al. 2023

2023 IEEE Industry Applications Society Annual Meeting (IAS)

View full text Add to dashboard Cite

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Simplified electrical test procedures for components of isolated LPS

Cited by 7 publications

References 0 publications

Evaluation of the Electric Stress on an Insulating Down-Conductor Caused by Lightning Strikes through ATP-EMTP Simulations

Evaluation of the Electric Stress on an Insulating Down-Conductor Caused by Lightning Strikes through ATP-EMTP Simulations

Distribution of real lightning strokes and their influence on test procedures for isolated LPS

Influence of humidity and pollution on the dielectric strength of components used in Isolated LPS

Contact Info

Product

Resources

About