Simplified mathematical approach to XRF secondary excitation

Uranium and cerium were studied in nitric acid solutions after presentation to an energydispersive x-ray fluorescence (EDXRF) spectrometer on filter-paper fixed on Scotch tape. ce La and U La peaks were used as aaalyte lines after excitation with a tungsten tube target at low potential (20 kV). These non-conventional excitation conditions were considered to be suitable for low contents of cerium strongly but high contents of uranium weakly in a nuclear fuel. Lower net integrated line intensities observed in an actinide as compared with a lanthanide are discussed along with the scattered, Auger and Coster-Kronig intensities responsible for the production of background before calibrations with known concentrations. Difiiculties in establishing an explicit relationship between these with change in matrix composition are discussed. The known concentrations of the mixed solutions when compared with the results from various computer programs using regression analysis showed that the algorithm developed by Plesch and Thiele for Siemens is better than the others. An accuracy of <2% was achieved. The importance of certified, standard or simulated reference materials is realized for quality analysis of occasional samples.

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Studies of uranium—cerium admixture solutions by EDXRF spectroscopy

Hanif

Hasany

et al. 1995

X-Ray Spectrometry

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Self‐element secondary fluorescence enhancement in XRF analysis

Karydas

2005

X-Ray Spectrometry

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In XRF analysis, the need for improved quantification approaches for non-homogeneous samples requires a better understanding of all the energy-dispersive spectrum features, in particular, the K/L or L/M intensity ratios among the characteristic x-rays of the same element. These ratios are affected by the secondary fluorescence contribution of the more energetic characteristic x-rays (K-or L-lines) to the corresponding one of lower energy (L-or M-lines, respectively). Theoretical calculations of the secondary fluorescence contribution among the characteristic x-ray lines of the same element (self-element secondary fluorescence enhancement) are presented for pure element targets by means of the fundamental parameter approach. For representative cases, the calculations were also performed for different exciting monochromatic x-ray beam energies and as a function of the target thickness. The calculations predict that for pure targets and monochromatic exciting radiation, the self-element secondary fluorescence enhancement contributes to the primary fluorescence intensity in a non-negligible amount, up to about 20-25%. An experimental approach is proposed for the estimation in thick pure targets of the relative increase of the M a,b fluorescence intensity due to the L-line self-element secondary fluorescence enhancement.

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Radiation applications in art and archaeometry

Milazzo

2004

Nuclear Instruments and Methods in Physics Research Section B:

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Simplified mathematical approach to XRF secondary excitation

Cited by 3 publications

References 5 publications

Studies of uranium—cerium admixture solutions by EDXRF spectroscopy

Studies of uranium—cerium admixture solutions by EDXRF spectroscopy

Self‐element secondary fluorescence enhancement in XRF analysis

Radiation applications in art and archaeometry

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