SIMS, AES, work function and flash desorption measurements of the CO adsorption on NiCu alloy surfaces

Benndorf, Carsten; Goetz, R.; Gressmann, K.H.; Kessler, J.; Thieme, F.

doi:10.1016/0039-6028(78)90111-5

Cited by 22 publications

(3 citation statements)

References 25 publications

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“…The adsorption of CO on Ni increased the Ni + ion yield by a factor of 2, a similar effect being reported for SIMS experiments in the keV region [13]. Furthermore, a Ni(C0) + line was observed as well as an enhancement of the C + and 0 + lines.…”

Section: Surfaces Under Gas Adsorptionsupporting

confidence: 80%

High Energy Sputtering from Cleaned Metal Foils

Krueger

Wien

1978

Zeitschrift Für Naturforschung A

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Positive and negative secondary ions desorbed from metal foils by bombardment with 252 Cf fission products have been investigated by time-of-flight mass spectroscopy. The measurements were performed under UHV conditions using metal foils of Cu, Ni and Al cleaned by Ar-ion etching. Spectra were taken with cleaned surfaces and also under the exposure of H2 , 02, N2 , CO, C2H4 , C2H6 and C3H70H up to several 100 L. The yields of metal ions from clean metal surfaces are in agreement with Sigmund' theory.

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Section: Surfaces Under Gas Adsorptionsupporting

confidence: 80%

High Energy Sputtering from Cleaned Metal Foils

Krueger

Wien

1978

Zeitschrift Für Naturforschung A

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“…AES was used to identify impurities in the protective oxide films obtained on Cu-Ni by etching or anodizing (283). The adsorption of CO on Cu-Ni (and on the individual metals) was examined bv SIMS, , TD, and MS (31).…”

Section: Metalsmentioning

confidence: 99%

“…The adsorption of CO on single crystal nickel was studied by AES, LEED, and TD (133), LEED (7), EELS (39), and ISS (188); an investigation of nickel and Cu-Ni alloy surfaces was carried out with SIMS, , and TD (31). Stay times on polycrystalline nickel were determined for Xe, Kr, and C02 using a pulsed molecular beam (428).…”

Section: Metalsmentioning

confidence: 99%

Surface characterization

Kane¹,

Larrabee²

1979

Anal. Chem.

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Phillip F. Kane's long career with chemical analysis began in 1938 at the quality control laboratories of Standard Telephones and Cables Ltd., London. While there he studied part time at London University and was graduated in 1948. The following year he joined Laporte Chemicals Ltd., Luton, England, where he developed methods for trace determinations in hydrogen peroxide and organic peroxides. In 1957 he joined the Chemagro Corp. in Kansas City, Mo., to direct a group developing methods for the analysis of organophosphorus pesticides. Since 1959 he has been with Texas Instruments in Dallas and has concentrated his research efforts in the characterization of semiconductor materials. He is currently director of their Materials Characterization Laboratory. Mr. Kane has published a number of articles in Analytical Chemistry, Journal of Agricultural and Food Chemistry, and Chemical Technology. Co-author of the book "Characterization of Semiconductor Materials" and co-editor of the book, "Characterization of Solid Surfaces", he is also a contributor to "Standard Methods of Chemical Analysis" and "Annual Reviews of Materials Science". Mr. Kane is a member of the Society for Applied Spectroscopy (National President-Elect) and the Chemical Society (London) and a Fellow of the Royal Institute of Chemistry. He is currently serving on the Advisory Board of Analytical Chemistry.Graydon B. Larrabee has received his M.Sc.

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3.7.3 Adsorption of diatomic molecules on alloy surfaces

Nieuwenhuys¹

Adsorbed Layers on Surfaces

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SIMS, AES, work function and flash desorption measurements of the CO adsorption on NiCu alloy surfaces

Cited by 22 publications

References 25 publications

High Energy Sputtering from Cleaned Metal Foils

High Energy Sputtering from Cleaned Metal Foils

Surface characterization

3.7.3 Adsorption of diatomic molecules on alloy surfaces

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