SIMS and XPS studies of polyurethane surfaces 2. Polyurethanes with fluorinated chain extenders

Hearn, M. J.; Briggs, D.; Yoon, Sung Chul; Ratner, Buddy D.

doi:10.1002/sia.740100803

Cited by 118 publications

(42 citation statements)

References 19 publications

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“…Numerous experimental techniques including Fourier transform infrared (FTIR) spectroscopy [5,6], near-infrared (NIR) spectroscopy [7,8], differential scanning calorimetry (DSC) [5,[9][10][11], dynamic mechanical analysis (DMA) [12,13], transmission electron microscopy (TEM) [14,15], X-ray photoelectron spectroscopy (XPS) [5,[16][17][18], and many others have been used to analyze phase separation in polyurethanes.…”

Section: Reinforcementmentioning

confidence: 99%

Adhesion mechanisms of polyurethanes to glass surfaces. Part II. Phase separation in polyurethanes and its effects on adhesion to glass

Agrawal

Drzal

1995

Journal of Adhesion Science and Technology

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Section: Reinforcementmentioning

confidence: 99%

Adhesion mechanisms of polyurethanes to glass surfaces. Part II. Phase separation in polyurethanes and its effects on adhesion to glass

Agrawal

Drzal

1995

Journal of Adhesion Science and Technology

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“…Angle-dependent XPS and static secondary ion mass spectroscopy (SSIMS) analysis of this PEU indicated that the surface was enriched with the ether segments of the polymer. 21 The sample was centrifugally cast onto glass coverslips from a 20 mg ml-I solution in DMAC. The glass coverslips were cleaned prior to polymer casting, following the procedure suggested by Ratner et a1."…”

Section: Samplesmentioning

confidence: 99%

Regularization: A stable and accurate method for generating depth profiles from angle‐dependent XPS data

Tyler

Castner

Ratner

1989

Surface & Interface Analysis

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153

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An algorithm for generating depth profiles from angle-dependent XPS data has been developed. The algorithm uses the regularization method with non-negativity constraints. Four criteria for determining the optimal amount of solution smoothing have been investigated. A criterion that uses the least-squared error in the regenerated data set proved most effective for selecting the optimal smoothing. Simulated data for a two-layer sample were used to investigate the effects of the number of data points, where each data point consisted of the spectra acquired at a take-off angle. Simulated data were also used to investigate the effect of random error on the calculated depth profiles. Increasing the number of data points improved the resolution at the interface. Greater than 10% error could be added to the data without affecting the stability of the algorithm. The algorithm has also been tested on actual angledependent XPS data sets from a thin polyurethane film on gold, a thin silicon oxide film on silicon, and a thick polyetberurethane film on glass. Performance of the regularization algorithm has been compared to an algorithm that uses a singular value decomposition of angldependent XPS data to generate depth profiles. The regularization algorithm demonstrates significantly improved stability and accuracy with roughly equal computational difficulty. Using the regularization algorithm, a quantitative estimate of the depth profile in the upper 100 region of a sample can be calculated using data with > 10% error and using as few as three data points.

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“…15,16 Static SIMS is much more surface sensitive than XPS and, because of its basis in mass spectrometry, more chemically selective too. The extremely high analytical sensitivity of static SIMS, the sampling depth of 10-15Å for polymers 17 and molecular information about both protein film chemistry and substrate chemistry offer the potential to gain a detailed understanding of the composition, structure, conformation and orientation of adsorbed protein films. Previously we have refined our abilities to interpret the static SIMS spectra of proteins, allowing individual amino acids to be monitored unambiguously.…”

Section: Introductionmentioning

confidence: 99%

Static time‐of‐flight secondary ion mass spectrometry and x‐ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films

Tidwell,

Castner,

Golledge

et al. 2001

Surface & Interface Analysis

130

117

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Static time-of-flight secondary ion mass spectrometry (ToF-SIMS), monochromatized x-ray photoelectron spectroscopy (XPS) and 125 I radiolabeling have been used to characterize albumin films adsorbed onto titanium, gold, polytetrafluoroethylene and r.f. glow discharge-deposited tetrafluoroethylene (TFE) substrates. A comparison between albumin and fibronectin films also was made. The intensities of characteristic amino acid mass fragments (immonium ions) detected in the static ToF-SIMS experiments depended on the protein type, the substrate type and the adsorption conditions, demonstrating the sensitivity of static ToF-SIMS for probing the structure of adsorbed protein films. Based on the results from albumin and fibronectin, static ToF-SIMS can provide information about the identity of adsorbed proteins and their conformation, orientation, denaturation, etc. X-ray photoelectron spectroscopy can distinguish pure protein films, but the higher molecular specificity of static ToF-SIMS is more useful than XPS for examining complex protein films. The 125 I radiolabeling experiments and the XPS atomic percentage of nitrogen were used to quantify the amount of adsorbed protein.

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SIMS and XPS studies of polyurethane surfaces 2. Polyurethanes with fluorinated chain extenders

Cited by 118 publications

References 19 publications

Adhesion mechanisms of polyurethanes to glass surfaces. Part II. Phase separation in polyurethanes and its effects on adhesion to glass

Adhesion mechanisms of polyurethanes to glass surfaces. Part II. Phase separation in polyurethanes and its effects on adhesion to glass

Regularization: A stable and accurate method for generating depth profiles from angle‐dependent XPS data

Static time‐of‐flight secondary ion mass spectrometry and x‐ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films

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