2002
DOI: 10.1081/tma-120002459
|View full text |Cite
|
Sign up to set email alerts
|

Sims Investigations of Gettering Centers in Ion-Implanted and Annealed Silicon

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

2002
2002
2004
2004

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 7 publications
(4 citation statements)
references
References 7 publications
0
4
0
Order By: Relevance
“…Secondary ion mass spectrometry (SIMS), a method mainly used by physicists for material analysis (for recent references see, e.g., Gammer et al [2002] or Korobeinikova et al [2002]), has revealed intracellular calcium changes associated with the recall function in flax seedlings previously subjected to cold shock or other external stimuli . Early attempts (Henry-Vian et al, 1995 a, b) Global view of the system.…”
Section: Discussionmentioning
confidence: 99%
“…Secondary ion mass spectrometry (SIMS), a method mainly used by physicists for material analysis (for recent references see, e.g., Gammer et al [2002] or Korobeinikova et al [2002]), has revealed intracellular calcium changes associated with the recall function in flax seedlings previously subjected to cold shock or other external stimuli . Early attempts (Henry-Vian et al, 1995 a, b) Global view of the system.…”
Section: Discussionmentioning
confidence: 99%
“…Further study of the model systems discussed above would benefit from knowledge of the distribution of ions. This may be provided by secondary ion mass spectrometry (SIMS), a method largely used by physicists for materials studies (see, e.g., [29,30]), now available for application to biological specimens [31][32][33] after appropriate preparation of dehydrated tissue sections [34,35] or using frozen hydrated samples [36].…”
Section: Discussionmentioning
confidence: 99%
“…SIMS is a standard microanalytical and imaging technique used in physics [24][25][26] and biology. [27] Briefly, it consists in bombarding under high vacuum a solid specimen (here a thin section of a resin-embedded hypocotyl sample) with a beam of accelerated ions (primary ions) a few keV in energy.…”
Section: Sims Imagingmentioning
confidence: 99%