2020
DOI: 10.1016/j.spmi.2020.106539
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Simulation and optimization of InGaN Schottky solar cells to enhance the interface quality

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Cited by 12 publications
(4 citation statements)
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“…When In molar fraction increases within the InGaN-based alloy, the background electron concentration tends to increase. Thus, the presented structure considered an electron concentration for intentional and non-intentional n-type doped layers with a free electron concentration ≥ 10 19 cm −3 [3,[16][17][18][19][20][21][22][23][24][25][26]. The high electron concentration can be attributed to the low temperature required to grow InGaN layers with high In content, provoking native defects, such as nitrogen vacancies [28][29][30].…”
Section: Methodsmentioning
confidence: 99%
“…When In molar fraction increases within the InGaN-based alloy, the background electron concentration tends to increase. Thus, the presented structure considered an electron concentration for intentional and non-intentional n-type doped layers with a free electron concentration ≥ 10 19 cm −3 [3,[16][17][18][19][20][21][22][23][24][25][26]. The high electron concentration can be attributed to the low temperature required to grow InGaN layers with high In content, provoking native defects, such as nitrogen vacancies [28][29][30].…”
Section: Methodsmentioning
confidence: 99%
“…Over the last couple of decades, Semiconductors of the type III-N are of growing interest through various studies such as gallium nitride (GaN), aluminium nitride (AlN) and indium nitride (InN) with a gap of 3.4eV, 6.2eV and 0.7eV respectively [1][2][3][4]. III-N semiconductors has been widely used in optoelectronics, as they have the following characteristics: robust, having a high thermal conductivity, high melting point, and, moreover, a direct forbidden band gap [5].…”
Section: Introductionmentioning
confidence: 99%
“…Recently, third-generation solar cells, including InGaN solar cells, have been actively investigated for obtaining high conversion e ciency [32]- [33]. InGaN alloy has exhibited potential in photodetectors, electronic devices, [34] and laser diodes [35].…”
Section: Introductionmentioning
confidence: 99%