2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2016
DOI: 10.1109/ipfa.2016.7564287
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Simulation assisting EMMI technical to locate defect on capacitor in integrated circuit failure analysis

Gaojie Wen1,
Tian Liu2,
Dazhong Fan3
et al.
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