Simulation of layer measurement with confocal micro-XRF

Huber, Christian; Smolek, S.; Streli, Christina

doi:10.1002/xrs.2536

Cited by 6 publications

(3 citation statements)

References 13 publications

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“…Sequential series of confocal XRF measurements along lines and planes allows to visualize the distribution of chemical elements of interest in one or two dimensions, creating, for example, virtual depth profiles, and two-or three-dimensional distributions inside the materials of interest [23,100,101]. After its original introduction at synchrotron radiation facilities [97,[101][102][103][104][105], the feasibility of performing confocal XRF measurements using tube sources was demonstrated by several groups around the world [106][107][108][109][110], along with appropriate deconvolution, quantification, and simulation models [111][112][113][114][115][116][117][118]. Several papers have been recently been published where confocal XRF measurements are exploited for sub-surface examination of painted works of art [119][120][121][122][123][124], next to pottery [125], coins [86], stained glass [126,127], painted metal sheet [128], and natural rock samples [129].…”

Section: _####_ Page 6 Of 51mentioning

confidence: 99%

Non-Invasive and Non-Destructive Examination of Artistic Pigments, Paints, and Paintings by Means of X-Ray Methods

et al. 2016

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Recent studies are concisely reviewed, in which X-ray beams of (sub)micrometre to millimetre dimensions have been used for non-destructive analysis and characterization of pigments, minute paint samples, and/or entire paintings from the seventeenth to the early twentieth century painters. The overview presented encompasses the use of laboratory and synchrotron radiation-based instrumentation and deals with the use of several variants of X-ray fluorescence (XRF) as a method of elemental analysis and imaging, as well as with the combined use of X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS). Microscopic XRF is a variant of the method that is well suited to visualize the elemental distribution of key elements, mostly metals, present in paint multi-layers, on the length scale from 1 to 100 μm inside micro-samples taken from paintings. In the context of the characterization of artists' pigments subjected to natural degradation, the use of methods limited to elemental analysis or imaging usually is not sufficient to elucidate the chemical transformations that have taken place. However, at synchrotron facilities, combinations of μ-XRF with related methods such as μ-XAS and μ-XRD have proven themselves to be very suitable for such studies. Their use is often combined with microscopic Fourier transform infra-red spectroscopy and/or Raman microscopy since these methods deliver complementary information of high molecular specificity at more or less the same length scale as the X-ray microprobe techniques. Since microscopic investigation of a relatively limited number of minute paint samples, taken from a given work of art, may not yield representative information about the entire artefact, several methods for macroscopic, non-invasive imaging have recently been developed. Those based on XRF scanning and full-field hyperspectral imaging appear very promising; some recent published results are discussed.

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Section: _####_ Page 6 Of 51mentioning

confidence: 99%

Non-Invasive and Non-Destructive Examination of Artistic Pigments, Paints, and Paintings by Means of X-Ray Methods

et al. 2016

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“…The authors proposed a new correction procedure that was suitable for the determination of trace elements in a uniform matrix. With the increasing importance of confocal XRF measurements and the number of instruments being made available, it is pleasing to see the report 110 by researchers at Atominstitut (TU Vienna) on the modelling of the measurement of layered structures in a benchtop confocal m-XRF system. A particular benet of this simulation tool, which used analytical functions rather than MC simulation, was that it allowed the authors to optimise the instrument setup prior to making measurements, thereby improving data quality and greatly reducing instrument time.…”

Section: Quantication and Data Processingmentioning

confidence: 99%

2015 Atomic Spectrometry Update – a review of advances in X-ray fluorescence spectrometry and their applications

West¹,

Ellis

Potts

et al. 2015

J. Anal. At. Spectrom.

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“…The authors presented reconstructed concentration profiles for different types of paint layers, although no validation was presented. A simplified model based on fundamental parameters for simulation of measurement of layered samples in confocal geometry was presented by Streli et al 8 A more detailed fundamental parameter based model, applicable to stratified samples, was developed by Malzer and Kanngießer. 9 This model was recently extended 10 to take the experiment in tilted geometry into account.…”

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confidence: 99%

Depth Profiling of Element Concentrations in Stratified Materials by Confocal Microbeam X-ray Fluorescence Spectrometry with Polychromatic Excitation

et al. 2014

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The confocal microbeam X-ray fluorescence technique is a well-established analytical tool that is widely used for qualitative and quantitative analysis of stratified materials. There are several different reconstruction methods dedicated to this type of samples. However, these methods are applicable with monochromatic excitation only. The full description of matrix effects and geometrical effects for polychromatic X-ray photons in confocal geometry is a demanding task. In the present paper, this problem was overcome by the use of effective energy approximation. The reduction of the whole energy dimension into one effective value eliminates the necessity of integration over the primary beam energy range for a number of basic parameters. This simplification is attainable without loss of the accuracy of analysis. The proposed approach was validated by applying it to the reconstruction of element concentration depth profiles of stratified standard samples measured with tabletop confocal microbeam X-ray fluorescence setup and by comparing the obtained results of two independent algorithms.

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Simulation of layer measurement with confocal micro-XRF

Cited by 6 publications

References 13 publications

Non-Invasive and Non-Destructive Examination of Artistic Pigments, Paints, and Paintings by Means of X-Ray Methods

Non-Invasive and Non-Destructive Examination of Artistic Pigments, Paints, and Paintings by Means of X-Ray Methods

2015 Atomic Spectrometry Update – a review of advances in X-ray fluorescence spectrometry and their applications

Depth Profiling of Element Concentrations in Stratified Materials by Confocal Microbeam X-ray Fluorescence Spectrometry with Polychromatic Excitation

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