Simulation of silicon surface-pattern formation under irradiation with 1-keV Ar ions

Gubarev, A. A.; Yakovlev, D. A.

doi:10.1134/s1027451012080101

J. Synch. Investig.

2012

DOI: 10.1134/s1027451012080101

|View full text |Cite

Simulation of silicon surface-pattern formation under irradiation with 1-keV Ar ions

A. A. Gubarev

D. A. Yakovlev

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2014

Publication Types

Select...

Article3

Relationship

Self Cite0

Independent3

Authors

Journals

Cited by 3 publications

References 21 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Simulation of silicon surface-pattern formation under irradiation with 1-keV Ar ions

Cited by 3 publications

References 21 publications

Analysis of the dislocation structure at the Ge/Si(111) heterointerface

Analysis of the dislocation structure at the Ge/Si(111) heterointerface

Influence of the high-intensity short-pulse implantation of ions on the properties of polycrystalline silicon

Change in the optical properties of borosilicate glass under atom bombardment at grazing incidence angles

Contact Info

Product

Resources

About