Simulation of TID Effects in a High Voltage Ring Oscillator

Simulation of a ring oscillator operation during γ-ray irradiation using the TID response model of MOSFETs and its experimental verification

“…In Sect. 3, we applied the proposed model to a ring oscillator circuit [16][17][18][19] and confirmed that it can reproduce the changes in circuit characteristics that occur during irradiation. In Sect.…”

System Health Awareness in Total-Ionizing Dose Environments

“…These FPGA test circuits represent simplified versions of the circuits that make up a microcontroller arithmetic logic core, indicating that significant increases in propagation delay for microcontrollers can be expected. Additionally, published results with ring oscillators in a high voltage process revealed significant changes in the propagation delay characteristics of the inverters, resulting in significant changes in the frequency of the ring oscillator [55]. While the ring oscillator experiment had transistor-level information available, COTS microcontrollers are complex systems with many thousands of transistors making the supply voltage and timing window technique demonstrated in this paper necessary.…”

A Review of Techniques for Ageing Detection and Monitoring on Embedded Systems

“…Trapped charges accumulate over time and modify the transistor characteristics. The effect of radiation has been studied in many components commonly found in embedded systems: signal propagation changes within ICs [21], impact on voltage regulators [22], System-On-Chips and microcontrollers [23]- [25].…”

“…For each voltage, there is a maximum operating frequency at which software is executed successfully. This frequency decreases as the TID increases [21]. They proposed an external test to measure the impact of TID in the propagation delay of an ATMEGA328P microcontroller, observing violations on timing windows under multiple voltage and frequency conditions while the device was exposed to different values of TID and executed functional tests.…”