Simulations of Si(Li) x‐ray detector response

Campbell, J. A.; McDonald, Leonard; Hopman, Theodore; Papp, T.

doi:10.1002/xrs.492.abs

Cited by 16 publications

(31 citation statements)

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“…[6,8,11] The approach presented in this article is similar to that of Lowe [9] concerning the description of the shelf. The concept of carrier collection probability [6,7] is used to describe the tail.…”

Section: Introductionmentioning

confidence: 99%

Modelling the response function of energy dispersive X‐ray spectrometers with silicon detectors

2009

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A new, analytical description of the physical processes determining the spectral response of an energy dispersive X-ray spectrometer with a silicon detector (Si(Li) or silicon drift detector (SDD)) is presented. The model considers the detector statistical noise, the electronic noise, the incomplete charge collection (ICC) that gives rise to the peak tailing, the escape effect, the fluorescence of the front contact or the dead layer and hot photoelectrons that cause the shelf. Only five free parameters are necessary to model the response function: the electronic noise, three parameters describing the shape of the charge collection efficiency beneath the front contact and the thickness of the detector front layer. Once the five parameters are adjusted to have agreement between a measured and a calculated response function, the response function can be calculated for any other photon energy in the range from 0.1 keV to 30 keV.The algorithm is implemented in IDL and MATLAB and is available also as MATLAB stand-alone program. It enables the determination of the optimum parameter set by fitting a calculated response function to a measured one for monochromatic radiation. A (m,n)-type matrix can be calculated whereby m represents the number of channels for the response function and n the number of photon energies in the selected range. The matrix can be used to convolute a calculated spectrum for comparison with a measured one.The calculated response functions are in agreement with the pulse height distributions measured with monochromatic synchrotron radiation in the energy range from 0.1 keV to 10 keV for three spectrometers with detector crystals different in construction. It is shown that the improved description of the detector response enables the detection of minor components of characteristic lines in fluorescence spectra, which have been attributed earlier to the detector.

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Section: Introductionmentioning

confidence: 99%

Modelling the response function of energy dispersive X‐ray spectrometers with silicon detectors

2009

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“…. Lines due to possible ''escape'' of incident lines in the detector (depending on the detector and on energy and intensity of involved lines) [2,37,38]. .…”

Section: X-ray Spectrummentioning

confidence: 99%

“…Then, after selecting the various peaks corresponding to the chemical elements, the ''area'' of the peaks should be determined, considering the influence of the background and of scattered radiation. Finally, counts should be correlated to concentration, according to Equations (9), (10), and (12), through the fundamental-parameter approach [38][39][40][41][42] or by using internal or external standards.…”

Section: Quantification Of Xrf Analysismentioning

confidence: 99%

X-Ray Fluorescence Spectrometry

Cesareo

2010

Ullmann's Encyclopedia of Industrial Chemistry

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“…As longwave primary radiation is absorbed by the window of an x-ray tube, the background in this spectral region can be caused either by the bremsstrahlung of photoelectrons, Auger electrons, and Compton electrons arising in the irradiated material [1,2] or by the instrumental factors related to incomplete charge collection in detecting short-wave x radiation [3,4].…”

Section: Introductionmentioning

confidence: 99%

Bremsstrahlung of the free electrons arising in an irradiated specimen

2009

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A model of the bremsstrahlung produced by photoelectrons, Auger electrons, and Compton electrons arising in an irradiated specimen is proposed. Calculations have shown that the contribution of the Compton electron bremsstrahlung shows up for monochromatic primary radiation of high-energy photons. For the primary radiation of x-ray tubes, only the bremsstrahlung spectrum of photoelectrons and Auger electrons is significant. The factors affecting the proportions between these components are considered. The bremsstrahlung spectral distribution of the mentioned electrons shows considerable deviations from that predicted by the Kramers theory that are due to the large depth of their occurrence and to the ambiguity of their energy. The region of the spectrum has been determined where the intensity of the electron bremsstrahlung is greater than the intensity of the x-ray tube polychromatic primary radiation scattered by the irradiated object.

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Simulations of Si(Li) x‐ray detector response

Cited by 16 publications

References 0 publications

Modelling the response function of energy dispersive X‐ray spectrometers with silicon detectors

Modelling the response function of energy dispersive X‐ray spectrometers with silicon detectors

X-Ray Fluorescence Spectrometry

Bremsstrahlung of the free electrons arising in an irradiated specimen

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