Simultaneous AFM and STM measurements on theSi(111)−(7×7)surface

The effect of sample resistivity on Kelvin probe force microscopy

“…It is also another explanation for a drop in the exponential character of the tunneling current, as has been previously reported. 19 While it might be surprising that a model based upon a Drude approximation should be so accurate given the quantum nature of the tip-sample junction, the accuracy of Ohm's law at the atomic scale has been recently reported with careful transport measurements. We would like to thank T. Hofmann and T. Wutscher for their help with the experimental setup.…”

A Preparation Method for Atomically Clean Sapphire Surfaces and High Resolution Topographic Method for Their Imaging by Non-Contact Atomic Force Microscopy

“…Longrange forces such as the electrostatic force and van der Waals force cause low resolution images. 34) Since the van der Waals force depends on the radius of the tip apex curvature, 35) it is not likely to happen the tip-curvature change at step edge in each scan line. This means that this contrast change is likely the effect of the electrostatic force.…”

Simultaneous measurement of tunneling current and atomic dipole moment on Si(111)-(7 × 7) surface by noncontact scanning nonlinear dielectric microscopy

“…Another problem is that simultaneous imaging may suffer from spurious contrast generated by feedback control for maintaining the tip-sample distance. 15 Constant-height imaging is useful for determining whether the atomic resolution of the simultaneously acquired image is an artifact of feedback. In this paper, we discuss the origin of atomic contrast of NC-SNDM based on simultaneous imaging of the topography, e 3 ðA cos hÞ, and time-averaged tunneling current of a Si(111)-(7 Â 7) surface.…”