The effect of sample resistivity on Kelvin probe force microscopy

Weymouth, Alfred J.; Giessibl, Franz J.

doi:10.1063/1.4766185

Cited by 8 publications

(7 citation statements)

References 20 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In figure 5(b), V CPD is approximately 5.6 V in AM-KPFM, which is significantly larger than in FM-and heterodyne AM-KPFMs. The V CPD in FM-and heterodyne AM-KPFMs (0.09 and 0.05 V) in this measurement is consistent with the experimental value of approximately 0.021 V, which was measured by Giessibl et al [44]. Because FM-and heterodyne AM-KPFMs are very sensitive to short-range interactions as described in section 2, these results suggest that the stray capacitance effect seriously affects AM-KPFM measurements due to the spatially averaged CPD between the cantilever and the macroscopic structures, including the insulating optical fibre, the stray capacitance around the cantilever and the metal electrodes of the sample holder.…”

Section: The Stray Capacitance Effectsupporting

confidence: 93%

The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes

et al. 2013

View full text Add to dashboard Cite

The effect of stray capacitance on potential measurements was investigated using Kelvin probe force microscopy (KPFM) at room temperature under ultra-high vacuum (UHV). The stray capacitance effect was explored in three modes, including frequency modulation (FM), amplitude modulation (AM) and heterodyne amplitude modulation (heterodyne AM). We showed theoretically that the distance-dependence of the modulated electrostatic force in AM-KPFM is significantly weaker than in FM- and heterodyne AM-KPFMs and that the stray capacitance of the cantilever, which seriously influences the potential measurements in AM-KPFM, was almost completely eliminated in FM- and heterodyne AM-KPFMs. We experimentally confirmed that the contact potential difference (CPD) in AM-KPFM, which compensates the electrostatic force between the tip and the surface, was significantly larger than in FM- and heterodyne AM-KPFMs due to the stray capacitance effect. We also compared the atomic scale corrugations in the local contact potential difference (LCPD) among the three modes on the surface of Si(111)-7 × 7 finding that the LCPD corrugation in AM-KPFM was significantly weaker than in FM- and heterodyne AM-KPFMs under low AC bias voltage conditions. The very weak LCPD corrugation in AM-KPFM was attributed to the artefact induced by topographic feedback.

show abstract

Section: The Stray Capacitance Effectsupporting

confidence: 93%

The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes

et al. 2013

View full text Add to dashboard Cite

show abstract

“…64,75,76,83 Previously it was discussed that many factors can determine the detection of the atomic resolution during KPFM measurements, like resistivity of the sample or tiny metallic tip, distance between the tip and the sample, etc. 76,84 Therefore the presented results on the observation of the atomic contrast in the KPFM experiments on graphene-Ir(111) are still under discussion and can be the topic of further investigations.…”

Section: Kpfm Imagingmentioning

confidence: 96%

Multichannel scanning probe microscopy and spectroscopy of graphene moiré structures

Dedkov¹,

Voloshina

2014

Phys. Chem. Chem. Phys.

View full text Add to dashboard Cite

The graphene moiré structures on 4d and 5d metals, as they demonstrate both long (moiré) and short (atomic) scale ordered structures, are the ideal systems for the application of scanning probe methods. Taking graphene-Ir(111) as an example, we present the complex studies of this graphene-metal moiré-structure system by means of 3D scanning tunnelling and atomic force microscopy/spectroscopy as well as Kelvin-probe force microscopy. The results clearly demonstrate variation of the moiré and atomic scale contrast as a function of the bias voltage as well as the distance between the scanning probe and the sample, allowing one to discriminate between topographic and electronic contributions in the imaging of a graphene layer on metals. The presented results are compared with the state-of-the-art density functional theory calculations demonstrating excellent agreement between theoretical and experimental data.

show abstract

“…An AC voltage with adjustable DC offset is applied between a conducting AFM tip and the sample electrode. The resulting electrostatic force is detected by a lock-in amplifier and a feedback circuit controls the dc tip potential until the CPD is compensated [26][27][28]. The contact potential difference is defined as…”

Section: Kelvin Probe Force Microscopy Analysis Of P-and N-ganmentioning

confidence: 99%

Vertical current-flow enhancement via fabrication of GaN nanorod p–n junction diode on graphene

Ryu

Ram

Lee

et al. 2015

Applied Surface Science

View full text Add to dashboard Cite

The effect of sample resistivity on Kelvin probe force microscopy

Cited by 8 publications

References 20 publications

The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes

The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes

Multichannel scanning probe microscopy and spectroscopy of graphene moiré structures

Vertical current-flow enhancement via fabrication of GaN nanorod p–n junction diode on graphene

Contact Info

Product

Resources

About