Simultaneous generation and detection of ultrashort voltage pulses in low-temperature grown GaAs with below-bandgap laser pulses

Bieler, Mark; Pierz, K.; Siegner, U.

doi:10.1063/1.3078288

Cited by 9 publications

(16 citation statements)

References 19 publications

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“…Except for the type of microwave probe the setup is identical to the one discussed in Ref. [6]. Although we perform all measurements in the time domain, in which also the majority of experimental results is specified, the data analysis is carried out in the frequency domain.…”

Section: Experimental Setup Model For Data Analysis and Uncertaintymentioning

confidence: 99%

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Optoelectronic time-domain characterization of a 100 GHz sampling oscilloscope

Füser

Eichstädt

Baaske

et al. 2011

Meas. Sci. Technol.

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We have performed an optoelectronic measurement of the impulse response of an ultrafast sampling oscilloscope with a nominal bandwidth of 100 GHz within a time window of approximately 100 ps. Our experimental technique also considers frequency components above the cutoff frequency of higher-order modes of the 1.0 mm coaxial line, which is shown to be important for the specification of the impulse response of ultrafast sampling oscilloscopes. Additionally, we have measured the reflection coefficient of the sampling head induced by the mismatch of the sampling circuit and the coaxial connector which is larger than 0.5 for certain frequencies. The uncertainty analysis has been done using the Monte Carlo method of Supplement 1 to the 'Guide to the Expression of Uncertainty in Measurement' and correlations in the estimated impulse response have been determined. Our measurements extend previous work which deals with the characterization of 70 GHz oscilloscopes and the measurement of 100 GHz oscilloscopes up to the cutoff frequency of higher-order modes.

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Section: Experimental Setup Model For Data Analysis and Uncertaintymentioning

confidence: 99%

“…Optoelectronic techniques, in combination with femtosecond lasers, are well suited for the characterization of ultrafast sampling oscilloscopes, mainly due to their unmatched measurement bandwidth that even exceeds 1 THz [6]. The time and frequency axis of such techniques is traceable to the SI units.…”

Section: Introductionmentioning

confidence: 99%

Optoelectronic time-domain characterization of a 100 GHz sampling oscilloscope

Füser

Eichstädt

Baaske

et al. 2011

Meas. Sci. Technol.

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“…2 Low-temperature grown and erbium-doped gallium arsenide (LT GaAs, Er:GaAs) have commonly been used for PCS applications over several decades. [3][4][5] More recent work has demonstrated that the inclusion of selfassembling ErAs nanoparticles into the GaAs matrix offers tunable lifetimes and improves overall performance. 6,7 Fast switching capabilities and other favorable characteristics have led to photoconductive switches being widely employed in the generation and detection of ultrafast electrical pulses, 5 pulsed microwave power and radar technologies, 8 and terahertz (THz) imaging applications.…”

Section: Introductionmentioning

confidence: 99%

Picosecond Joule heating in photoconductive switch electrodes

et al. 2013

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We present experimental observations of picosecond Joule heating inside the gold metallization of ErAs:GaAs photoconductive switches. Femtosecond laser time-domain thermoreflectance is employed to resolve the fast thermal dynamics in the central switch electrode during generation and transmission of rf electrical pulses. Sharp features in the thermoreflectance signal scaling quadratically with the bias/pulse voltage reveal Joule heating with durations 5 ps inside the gold metal. The temporal shape and rise time of the signals is in excellent agreement with the theoretical pulse wave form and subpicosecond carrier lifetime of the active medium. Probing different locations on the electrode shows the propagation, attenuation, and dispersion of the electrical pulses along the coplanar waveguide structure. Overall, the presented photothermal experiments demonstrate great potential to reveal the internal dynamics of photoconductive switches, characterize transmission lines, and study ultrafast heating in metals.

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“…However, because a significant portion of the 900 nm laser power is transmitted through the GaAs substrate, and GaAs exhibits the EO effect, sampling is achieved by transmitting the focused sampling beam through a point between the center and outer conductors. This technique allows quasi-noninvasive sampling influenced only by propagation effects [9]. Detection of the change in polarization of the sampling beam is achieved as in the other two systems.…”

Section: Traceability At Ptbmentioning

confidence: 99%

“…The PTB system has been shown to be capable to generate and detect voltage pulses with a frequency spectrum extending up to 1 THz [9] and has been applied to the characterization of the time response of 70 GHz [10] and 100 GHz [3] sampling oscilloscopes. The measurement uncertainty is propagated using Monte-Carlo simulations, allowing for determination of correlations in the uncertainty estimate [3] and traceability of the full waveform measurement to the SI.…”

Section: Traceability At Ptbmentioning

confidence: 99%

Traceability of high-speed electrical waveforms at NIST, NPL, and PTB

Hale

Williams

Dienstfrey

et al. 2012

2012 Conference on Precision Electromagnetic Measurements

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Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-optic sampling that can be used to establish a traceable calibration chain between high-speed waveform measurements and the SI. These services are increasingly switching to a full waveform metrology paradigm, obtaining an estimate of the central value and associated uncertainty of the entire waveform as a function of time.Index Terms -Electro-optic sampling, metrology, oscilloscope, photodetector, pulse, ultrafast, uncertainty, waveform. I. FULL WAVEFORM METROLOGY AND TRACEABILITYAccurate electrical waveform measurements are required to assess modern data-intensive communications. Traditionally, a small collection of waveform parameters [1], such as transition duration and amplitude, have been used to specify a waveform. This leads to a loss of information since, for example, infinitely many different pulses may have the same transition duration but differ in other significant details. As increasingly complex waveforms are required to carry greater amounts of information this information loss becomes unacceptable and a new measurement paradigm is required.Our respective metrology institutes are developing such a paradigm, which we refer to as full waveform metrology. Its goal is an estimate of the central value and associated uncertainty at each time point. Because the corrections for systematic effects are conducted in the frequency domain, and our goal is also to characterize signals and devices in both the time-and frequency-domains, we must account for correlations between uncertainties at different times and/or frequencies as in, e.g., [2,3]. In the context of electrical measurements, this necessitates the additional characterization of impedance. From the full waveform measurement, uncertainties on any waveform parameter may be derived [2][3][4]. Using this paradigm, waveform measurement instruments and, in turn, signal sources can be made traceable to the SI.NIST, NPL, and PTB use electro-optic sampling (EOS) techniques, in conjunction with ultrafast lasers (duration ~100 fs), as primary standards for high-speed electrical measurements. Such techniques are capable of measurement bandwidths on the order of 1 THz and the dominant contributors to the measurement can be characterized traceably to the SI through physics-based measurement models. II. TRACEABILITY AT NISTNIST's primary EOS system [2,5] splits the linearly polarized output of a 1550 nm Erbium-doped fiber laser into pump and sampling beams to calibrate a 1.00 mm coaxially connectorized photodiode, which is then used in turn to calibrate lightwave component analyzers and a large class of waveform measurement instruments. When illuminated by the pump, the photodiode creates a series of electrical impulses at its coaxial output which propagate through a microwave probe to a coplanar waveguide (CPW) that is f...

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Simultaneous generation and detection of ultrashort voltage pulses in low-temperature grown GaAs with below-bandgap laser pulses

Cited by 9 publications

References 19 publications

Optoelectronic time-domain characterization of a 100 GHz sampling oscilloscope

Optoelectronic time-domain characterization of a 100 GHz sampling oscilloscope

Picosecond Joule heating in photoconductive switch electrodes

Traceability of high-speed electrical waveforms at NIST, NPL, and PTB

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