Simultaneous imaging of surface and magnetic forces

Forchheimer, Daniel; Platz, Daniel; Tholén, Erik A.; Haviland, David B.

doi:10.1063/1.4812979

Cited by 3 publications

(3 citation statements)

References 30 publications

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“…Microfabricated cantilevers can be optimized for different AFM applications and operational environments. For AFM performed under ambient conditions, microfabricated cantilevers can, for example, be operated in different oscillation modes [15] or at multiple frequencies [16][17][18][19][20][21][22][23] to simultaneously map different sample properties. Further, the high resonance frequency of microfabricated cantilevers combined with high-bandwidth cantilever deflection detection permits video-rate scanning [24], real-time peak force detection [25], or a later artificial intelligence processing of the vast amounts of data acquired during imaging [26,27].…”

Section: Introductionmentioning

confidence: 99%

A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

Liu¹,

Ahmed²,

Vranjkovic³

et al. 2022

Beilstein J. Nanotechnol.

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Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has become an important tool to characterize new material systems as well as devices. Current instruments permit robust scanning over large areas, atomic-scale lateral resolution, and the characterization of various sample properties using multifrequency and multimodal AFM operation modes. Research of new quantum materials and devices, however, often requires low temperatures and ultrahigh vacuum (UHV) conditions and, more specifically, AFM instrumentation providing atomic resolution. For this, AFM instrumentation based on a tuning fork force sensor became increasingly popular. In comparison to microfabricated cantilevers, the more macroscopic tuning forks, however, lack sensitivity, which limits the measurement bandwidth. Moreover, multimodal and multifrequency techniques, such as those available in cantilever-based AFM carried out under ambient conditions, are challenging to implement. In this article, we describe a cantilever-based low-temperature UHV AFM setup that allows one to transfer the versatile AFM techniques developed for ambient conditions to UHV and low-temperature conditions. We demonstrate that such a cantilever-based AFM offers experimental flexibility by permitting multimodal or multifrequency operations with superior force derivative sensitivities and bandwidths. Our instrument has a sub-picometer gap stability and can simultaneously map not only vertical and lateral forces with atomic-scale resolution, but also perform rapid overview scans with the tip kept at larger tip–sample distances for robust imaging.

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Section: Introductionmentioning

confidence: 99%

A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

Liu¹,

Ahmed²,

Vranjkovic³

et al. 2022

Beilstein J. Nanotechnol.

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“…The capabilities of MFM can be further enhanced by multifrequency 14 cantilever detection including bimodal [15][16][17][18][19] , intermodulation 20 and side band detection 21 .…”

mentioning

confidence: 99%

Simultaneous magnetic field and field gradient mapping of hexagonal MnNiGa by quantitative magnetic force microscopy

et al. 2023

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Magnetic force microscopy (MFM) is a scanning microscopy technique that is commonly employed to probe the sample’s magnetostatic stray fields via their interaction with a magnetic probe tip. In this work, a quantitative, single-pass MFM technique is presented that maps one magnetic stray-field component and its spatial derivative at the same time. This technique uses a special cantilever design and a special high-aspect-ratio magnetic interaction tip that approximates a monopole-like moment. Experimental details, such as the control scheme, the sensor design, which enables simultaneous force and force gradient measurements, as well as the potential and limits of the monopole description of the tip moment are thoroughly discussed. To demonstrate the merit of this technique for studying complex magnetic samples it is applied to the examination of polycrystalline MnNiGa bulk samples. In these experiments, the focus lies on mapping and analyzing the stray-field distribution of individual bubble-like magnetization patterns in a centrosymmetric [001] MnNiGa phase. The experimental data is compared to calculated and simulated stray-field distributions of 3D magnetization textures, and, furthermore, bubble dimensions including diameters are evaluated. The results indicate that the magnetic bubbles have a significant spatial extent in depth and a buried bubble top base.

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“…Another interesting experimental approach suited for low quality factor cantilevers is based on narrowband intermodulation atomic force microscopy. 6 In our work, we developed a non-contact bimodal magnetic force microscopy technique which can take advantage of the higher sensitivities provided by high quality factor cantilevers. It is optimally suited for operation in vacuum or UHV for highest sensitivity and thus best spatial resolution.…”

mentioning

confidence: 99%

Non-contact bimodal magnetic force microscopy

Schwenk

Marioni

Romer

et al. 2014

Applied Physics Letters

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A bimodal magnetic force microscopy technique optimized for lateral resolution and sensitivity for small magnetic stray fields is discussed. A double phase-locked loop (PLL) system is used to drive a high-quality factor cantilever under vacuum conditions on its first mode and simultaneously on its second mode. The higher-stiffness second mode is used to map the topography. The magnetic force is measured with the higher-sensitivity first oscillation mode. V

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Simultaneous imaging of surface and magnetic forces

Cited by 3 publications

References 30 publications

A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

Simultaneous magnetic field and field gradient mapping of hexagonal MnNiGa by quantitative magnetic force microscopy

Non-contact bimodal magnetic force microscopy

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