2017
DOI: 10.1117/1.jbo.22.1.015003
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Simultaneous measurement of refractive index and thickness of multilayer systems using Fourier domain optical coherence tomography, part 2: implementation

Abstract: We introduce a theoretical method for simultaneous measurement of refractive index and thickness of multilayer systems using Fourier domain optical coherence tomography (FD-OCT) without any auxiliary arrangement. The input data to the formalism are the FD-OCT measured optical path lengths (OPLs) and properly selected spectral components of FD-OCT interference spectrum. The outputs of the formalism can be affected significantly by uncertainty in measuring the OPLs. An optimization method is introduced to deal w… Show more

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Cited by 4 publications
(1 citation statement)
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“…[13][14][15][16] Both spectrometer-based spectral-domain (SD-OCT) and swept-source OCT (SS-OCT) realizations are similar from a theoretical point of view because the measured spectrum discretized by the CCD pixels can be interpreted the same as the timemultiplexed output of the balanced detector in SS-OCT configuration. 12,17,18 The method used in this work and the experimental results are based on SD-OCT configuration, but a similar approach can be utilized for SS-OCT devices.…”
Section: Methodsmentioning
confidence: 99%
“…[13][14][15][16] Both spectrometer-based spectral-domain (SD-OCT) and swept-source OCT (SS-OCT) realizations are similar from a theoretical point of view because the measured spectrum discretized by the CCD pixels can be interpreted the same as the timemultiplexed output of the balanced detector in SS-OCT configuration. 12,17,18 The method used in this work and the experimental results are based on SD-OCT configuration, but a similar approach can be utilized for SS-OCT devices.…”
Section: Methodsmentioning
confidence: 99%