2014
DOI: 10.1117/1.oe.53.4.044108
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Simultaneously measuring the refractive index and thickness of an optical sample by using improved fiber-based optical coherence tomography

Abstract: Abstract. An improved structure for the optical coherence tomography (OCT) scheme based on a 4 × 4 fiber coupler for simultaneously measuring the refractive index and thickness of optical samples is presented. The proposed structure incorporates the optical path length difference of interference light and is used to calculate the refractive index and thickness of an unknown sample without any prior knowledge of the sample parameters. Two methods (time-domain and Fourier-domain OCT) of obtaining information abo… Show more

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Cited by 5 publications
(2 citation statements)
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“…Besides medical and pharmaceutical applications, low coherence interferometry (upon which OCT is based) can be used to measure coating thickness (Kühnhold et al, 2015;Manallah et al, 2015) and optical properties of polymer films, such as topography (Ghim et al, 2013), roughness (Yoshino et al, 2017) and refractive indices (Yen et al, 2014). Also inline monitoring of coating process applications in industrial coaters (both for tablets and pellets) have been demonstrated (Sacher et al, 2019).…”
Section: Introductionmentioning
confidence: 99%
“…Besides medical and pharmaceutical applications, low coherence interferometry (upon which OCT is based) can be used to measure coating thickness (Kühnhold et al, 2015;Manallah et al, 2015) and optical properties of polymer films, such as topography (Ghim et al, 2013), roughness (Yoshino et al, 2017) and refractive indices (Yen et al, 2014). Also inline monitoring of coating process applications in industrial coaters (both for tablets and pellets) have been demonstrated (Sacher et al, 2019).…”
Section: Introductionmentioning
confidence: 99%
“…Several techniques have been reported for simultaneous measurement of refractive index and thickness using an OCT system in both TD and FD. These techniques suitable for single layer objects can be listed in TD as low-coherence reflectometry, [14][15][16][17][18] focus-tracking method, [19][20][21][22][23][24][25][26][27][28][29] bifocal optical coherence refractometry, 30,31 digital refocusing technique, 32,33 and tandem configuration of interferometers for dispersion-insensitive measurements. [34][35][36] In the FD approach, the simultaneous measurement of refractive index and thickness of a single layer object has been reported using a reference plane behind the object, 37,38 providing a step on the object, 39 using a dual sample probe 40 or by fitting a modeled signal to the actual spectrum.…”
Section: Introductionmentioning
confidence: 99%