A beam profile monitor utilizing visible synchrotron radiation (SR) from a
bending magnet has been designed and installed in Cornell Electron-Positron
Storage Ring (CESR). The monitor employs a double-slit interferometer to
measure both the horizontal and vertical beam sizes over a wide range of beam
currents. By varying the separation of the slits, beam sizes ranging from 50 to
500 um can be measured with a resolution of approximately 5 um. To measure
larger beam size (> 500 um), direct imaging can be employed by rotating the
double slits away from SR beam path. By imaging the pi-polarized component of
SR, a small vertical beam size (~70 um) was measured during an undulator test
run in CESR, which was consistent with the interferometer measurement. To
measure the bunch length, a beam splitter is inserted to direct a fraction of
light into a streak camera setup. This beam size monitor measures the
transverse and longitudinal beam sizes simultaneously, which is successfully
used for intrabeam scattering studies. Detailed error analysis is discussed.Comment: 26 pages, 13 figure