High-quality GaAs on the c-plane sapphire has been achieved
by
employing a two-step growth technique, multiple annealing, and an
AlAs nucleation layer using molecular beam epitaxy (MBE). The effect
of growth parameters, namely, growth temperature, As2 flux,
and low-temperature layer growth temperature (LTLGT) in two-step growth
have been investigated. In all of the grown samples, the epitaxial
orientation of the film is GaAs (111)A. Unlike the homoepitaxial GaAs
(111)A MBE growth, where increasing the As2 flux improves
the film quality, here the lowest As2 flux resulted in
the best film quality. Very low LTLGT resulted in highly twinned material
and film surface with many pits. Growth temperature also plays an
important role, as seen by the exceptional structural and optical
properties of samples grown at 650 °C, but at the cost of the
rough film surface. We have observed low-temperature photoluminescence
(PL) for all of the samples. However, for the first time, to the best
of our knowledge, room-temperature PL (RT-PL) has been demonstrated
from a heteroepitaxial GaAs (111)A film. This result is important
because RT-PL from the epitaxial GaAs/c-plane sapphire will lead to
the fabrication of GaAs laser on sapphire, which is an important functionality
to realize photonic circuits on the sapphire platform.