2005
DOI: 10.1109/radecs.2005.4365568
|View full text |Cite
|
Sign up to set email alerts
|

Single Event Effects in NAND Flash memory arrays

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
5
0

Year Published

2006
2006
2022
2022

Publication Types

Select...
4
3

Relationship

2
5

Authors

Journals

citations
Cited by 7 publications
(5 citation statements)
references
References 23 publications
0
5
0
Order By: Relevance
“…11 for a NOR array (NAND devices show similar effects [63]). A secondary peak appears after exposure to highly-ionizing particles [64].…”
Section: Radiation Effectsmentioning
confidence: 95%
“…11 for a NOR array (NAND devices show similar effects [63]). A secondary peak appears after exposure to highly-ionizing particles [64].…”
Section: Radiation Effectsmentioning
confidence: 95%
“…For these devices the control circuitry, rather than the array itself, has been found to be the most radiation-sensitive part of the device in most studies [17], [20]- [22]. However, charge loss following the impact of a single ion on a FG is all but negligible, and results in a shift of the FG MOSFET threshold voltage , as previously reported [23]- [28]. In particular, the charge loss from the FG following the strike of a single high LET ion is linked to the number of generated carriers, not to those surviving recombination [26], [27].…”
Section: Experimental and Devicesmentioning
confidence: 69%
“…TLC (and MLC to a lesser extent) 3D-NAND devices have low Program-Erase (P/E) limits, on the order of 3000, but this is not an issue for infrequent data transfers like we propose. TLC NAND is especially sensitive to Total Ionizing Dose, radiation-induced soft errors (Single bit upsets, multi-bit upsets, and functional interrupts), as well as some radiation-induced hard errors (stuck bits, dielectric breakdown) [19], [20], [21]. Thank-fully, for the purpose of this study, all of these effects can be mitigated with increased redundancy (i.e., increased weight and power).…”
Section: Onboard Storagementioning
confidence: 99%