Single event effects in RF and microwave ICs

Abstract

The present paper presents an overview and an analysis of single event effects (SEE) for a variety of RF and mi crowave ICs. New SEE test results obtained at the NRNU MEPhl test center have been used along with the published data. 3CDCDEKTbi B03.QE�CTB�fI OT.QEIlbHbIX fI.QEPHbIX LlACT�U B CBLI �C LJYKOB r. B, EneCVlH B. B., 6o�4eHKo,Q. B., KY3HelloB A. r., AM6YPKVlH K. M. Hau,uoHanbHblu uccneooeamenbcKuu floepHblU YHueepcumem «M0<P0» AHHomal.lUfInpe,ll CTaBIleH aHaIl�3 3cjJcjJeKToB B03,l1elii cTB�l'I OT,lIeIlbHbIX l'I,lIepHblX 4aCT�4 B CBY III C pa3Il�4Horo cjJYHK4�oHaIlb Horo Ha3Ha4eH�l'I, �3roToBIleHHbIX no 6a30BbiM nOIlynpOBO,ll H�KOBbIM TeXHOIlOr�l'IM. np�Be,ll eHbl 3Kcnep�MeHTaIlbHble ,lIaHHble �3 Il�Te paTypHblX �CT04H�KOB � op�r�HaIlbHble pe3YIlbTaTbi �CCIle,ll OBaH�Iii , nOIlY4eHHbie B �cnblTaTeIlbHolii Ila6opaTop�� 111 3n3 HIll 5'lY MIII <ll Ili.

Measurement Issues of Radio Frequency Integrated Circuits with Digital Control at Radiation Testing

“…Precision parameters of PSA ICs are determined from results of measuring the frequency dependency of S-parameters in each of the 2048 logical states of the IC. If the parallel control code is specified using mechanical switches (jumpers) and then saved as an S-parameter file, this may require several hours of continuous engineer work, which is unacceptable under the radiation testing [9][10][11].…”