Single Event-Induced Instability in Linear Voltage Regulators

Adell, P.C.; Witulski, A.F.; Schrimpf, R.D.; Marec, R.; Pouget, Vincent; Calvel, P.; Bezerra, F.

doi:10.1109/tns.2006.886214

Cited by 19 publications

(10 citation statements)

References 9 publications

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“…This structure is that of a typical low dropout voltage regulator [5] and similar structures have been tested under ionizing radiation [6], [7] and single events [2], [7]. In these two papers, LDPs due to peak detector effect were not reported, probably due to the use of very low load resistance values (2.2 Ω).…”

Section: A From Ideal Blocks To Actual Devices 1) Typical Low Drop-omentioning

confidence: 99%

“…During the following years, other authors confirmed the possibility of this kind of events [2]- [4]. Of particular importance was the work of Zanchi et al [4] who attributed the appearance of LPDs to external devices rather than internal components, i.e., LPDs in a band-gap BiCMOS voltage reference were related to an external capacitor used to stabilize the system and remove high frequency noise.…”

Section: Introductionmentioning

confidence: 95%

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Peak Detector Effect in Low-Dropout Regulators

Palomar

Franco

Lopez-Calle

et al. 2013

IEEE Trans. Nucl. Sci.

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Abstract-The peak detector effect is a phenomenon that makes single event transients much longer once an error amplifier switches from linear to saturation zone due to the presence of external capacitors. This is so-called since it was discovered in a simple voltage reference in which a parasitic lossy peak detector was unwillingly built in the output stage. In this paper, peak detector effect is generalized to explain the appearance of long duration pulses in typical low dropout voltage regulator built with discrete devices. This effect has been related to the way in which the negative feedback loop is closed and to the kind of pass device in the output stage. Thus, if the linear voltage regulator consists in an error amplifier the output of which controls a current source, the peak detector effect will occur if the current source is unidirectional, the output load does not drain enough current and is in parallel with an external capacitor.

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Section: A From Ideal Blocks To Actual Devices 1) Typical Low Drop-omentioning

confidence: 99%

Section: Introductionmentioning

confidence: 95%

Peak Detector Effect in Low-Dropout Regulators

Palomar

Franco

Lopez-Calle

et al. 2013

IEEE Trans. Nucl. Sci.

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“…3 is called Q12 at the datasheet by National Semiconductors [12]. The actual structure has been determined by several authors [7], [8], [10], [19], [20], although there are minor changes among the schematics provided by the different works. In particular, Fig.…”

Section: Resultsmentioning

confidence: 99%

“…The internal topology of the LM124 (Fig. 4) has been depicted in several papers [7], [8], [10], [19], [20] although scarce information is provided about the characteristic of the internal transistors. In fact, the typical procedure is separating the individual transistors by means of laser or ion beams and extract the SPICE parameters using a microprobe and specific instrumentation [18].…”

Section: A DC Behavior Of the Output Stagementioning

confidence: 99%

Modification of the LM124 Single Event Transients by Load Resistors

Franco

Lopez-Calle

Izquierdo

et al. 2010

IEEE Trans. Nucl. Sci.

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Abstract-The influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the transients. SPICE simulations helped to understand the reasons of this behavior and showed that the distortion is related to the necessity of providing or absorbing current from the load resistor, which forces the amplifier to modify its operation point. Finally, load effects were successfully used to explain the distortion of single event transients in typical feed-back networks and the results were used to explain experimental data reported elsewhere.

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“…The wide range of input voltages and variation in output loading conditions are critical parameters in determining SETs for these devices, but increase the complexity of radiation testing and data evaluation. It has also been reported that in some cases SETs can induce large signal instabilities [10].…”

Section: Introductionmentioning

confidence: 97%