2001
DOI: 10.1109/23.983136
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Single-event upset in the PowerPC750 microprocessor

Abstract: Proton and heavy ion upset susceptibility has been measured individually for six types of storage elements in an advanced commercial processor, the PowerPC750, from two manufacturers: Motorola and IBM. Data on interfering program malfunctions was also collected. Compared to earlier PPC603e results, the upset susceptibility has decreased somewhat.

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Cited by 36 publications
(15 citation statements)
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“…From [11], the raw proton SER cross section for the floating point register structure in a PowerPC 750 processor is about the same value. Since protons and neutrons have similar characteristics at higher energy range, we use the proton cross section to roughly estimate the raw neutron SER of different structures.…”
Section: Estimation Of λmentioning
confidence: 95%
See 1 more Smart Citation
“…From [11], the raw proton SER cross section for the floating point register structure in a PowerPC 750 processor is about the same value. Since protons and neutrons have similar characteristics at higher energy range, we use the proton cross section to roughly estimate the raw neutron SER of different structures.…”
Section: Estimation Of λmentioning
confidence: 95%
“…Irom et al [2] and Swift et al [11] report measured values of raw SER cross section for the TLB and floating point registers for PowerPC processors. The raw SER cross section is defined as the number of errors per particle influence and is related to the raw SER as follows [14]:…”
Section: Estimation Of λmentioning
confidence: 98%
“…In a multi-processor arrangement, both could meet the set target of 2500 MIPS while consuming less than 22 W, the SA1110 noticeably outperforming the PPC750 on power consumption. In terms of chip volume also, the SA1110 has a 256 ball miniBGA package whilst the PPC750 has a 360 ball CBGA, which is larger and, hence, more difficult to accommodate (note that the commonly quoted 7.6 mm x 8.8 mm PPC750 dimensions [Swift et al 2001], are for the silicon die only, and do not include the packaging). Relating PCB area with the provided computational resources the PPC750 yields only 48 MIPS/cm 2 , compared to 69.2 MIPS/cm 2 for the SA1110.…”
Section: Component Choicementioning
confidence: 99%
“…In the absence of detailed radiation tolerance figures, feature size provides an estimate of the survivability of individual processors. The PPC750 feature size is 0.29 µm with more than 6.3 million transistors [Swift et al 2001], and the SA1110 was manufactured in a 0.35 µm process with only 2.5 million transistors. Thus, the SA1110 may well survive slightly better than the PPC750 due to its older manufacturing process, although only detailed radiation testing would establish this definitively.…”
Section: Component Choicementioning
confidence: 99%
“…A number of researchers have looked at radiation effects in COTs microprocessors, including [5]- [8]. Recent publications have studied more modern microprocessors [9], [10] with reduced feature sizes and multiple processing cores.…”
Section: Introductionmentioning
confidence: 99%