2007
DOI: 10.1051/epjap:2007136
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Single injection space-charge-limited current in insulator with two sets of distributed traps

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Cited by 3 publications
(2 citation statements)
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“…However, trap-assisted SCLC (TSCLC, I∝V n , n>2) [26][27][28] is found to be the best fit for our device except for initial low voltage region. Voltage, where the current density increases, is called the trap-filled limit and depends on the total traps density and thickness of the sample, not on the distribution of traps [29,30]. The current in our device is affected by shallow traps (slope >2) according the low-exponent SCLC [20,31].…”
Section: Resultsmentioning
confidence: 99%
“…However, trap-assisted SCLC (TSCLC, I∝V n , n>2) [26][27][28] is found to be the best fit for our device except for initial low voltage region. Voltage, where the current density increases, is called the trap-filled limit and depends on the total traps density and thickness of the sample, not on the distribution of traps [29,30]. The current in our device is affected by shallow traps (slope >2) according the low-exponent SCLC [20,31].…”
Section: Resultsmentioning
confidence: 99%
“…[16][17][18][19]. According to the space-charge-limited conduction theory the classical current density vs. electric field dependence has several regions that start with the Ohmic conduction (typically very low current levels), followed by a classical Child's square-law behavior or a Trap Filled Limit (TFL) regime, which is commonly followed by a square-law behavior.…”
Section: Discussionmentioning
confidence: 99%