The Scanning Tunneling Microscope (STM) and Atomic Force Microscope (AFM) offer exciting new ways of imaging surfactant monolayers and bilayers with resolution to the sub-molecular scale. We present images of biological and synthetic surfactant monolayers and bilayers obtained with these techniques that demonstrate the possibilities and limitations of each. STM is used to image freeze--fracture replicas of the ripple phases of saturated phosphatidylcholines to show a previously unknown secondary ripple recently confirmed by X-ray diffraction. AFM is used to study the structure and defects of Langmuir-Blodgett films to a resolution never before attained, both under water and in air. The molecular spacing and lattice symmetry of the films are visible in phosphatidylethanolamine bilayers, and the images are suggestive of hexatic organization. In monolayers of cadmium arachidate, we have visualized point defects less than 10 nm in extent -about an order of magnitude smaller than any previous technique.In the 300 years of optical and 50 years of electron microscopy development, nothing has prepared us for the incredible imaging power and simplicity of the scanning tunneling and atomic force microscopes (1). The STM has the greatest proven resolution of any imaging technique; for ideal samples the lateral resolution is about 1Â and the vertical resolution is less than 0.1Â. The operating principle of the STM is surprisingly simple. A metal tip is brought close enough to the surface to be imaged that, at a convenient operating voltage (2 mV -2V), electrons begin to tunnel between the tip and the surface. The tip is scanned over the surface while the tunneling current is measured. A feedback network changes the height of the tip to keep the tunneling current constant in the so-called "constant current mode" or the current is monitored at constant tip height in the "constant height mode." In the morecommonly used constant current mode, if the current can be kept constant to 2%, then the gap between the surface and tip remains constant to within .01A (2). An image consists of a map of the tip height vs lateral position. The result is a threedimensional image of the scanned surface with atomic resolution.The Atomic Force Microscope (AFM) was developed in 1986 to image nonconductors and should be the ideal instrument for visualizing biological and organic