Slit-Surface Disturbance Lattice EBG Structure for Simultaneously Switching Noise Suppression in High-Speed Data Acquisition System

Abstract

Simultaneous switching noise (SSN) is verified as a serious impact on the quality of power distribution and accuracy of the data acquisition system in the mixed signal circuits by modeling and simulating the single-stage output buffer at the driver side. To reduce SSN, a board-level slit-surface disturbance lattice electromagnetic bandgap structure is proposed. The corresponding 1-D equivalent transmission line model is established and lower and upper bound cutoff frequencies of the bandgap are derived. Suitable test boards are fabricated and measured to demonstrate the accuracy of the design concept. The measured SSN reduced to 65% and the signal jitter is decreased by 75% comparing with the solid power/ground plane, which proves that the isolation between the analog and the digital signals can be enhanced to improve the quality of power distribution, and provides a new method to improve precision for data acquisition and transmission in power monitoring system. The results show that the simulated, modeled, and measured results are consistent.Index Terms-Electromagnetic bandgap (EBG), mixed-signal system, noise suppression, simultaneous switching noise (SSN), stopband enhancement.

A low noise low power 45 nm technology based simultaneous switching noise (SSN) reduction model for mixed signal VLSI circuits

“…Today's VLSI technology allows complex circuits to be fabricated in a single semiconductor silicon die with high speed digital logic fitted along with high performance circuits. Though the clock signal frequencies continue to increase but the MOS device sizes will continue to shrivel to Very Deep Sub Micrometer (VDSM) dimensions [3][4][5]. Reducing the device size not only implies shorter channel length but also decreasing device threshold voltages and decreasing inter connects.…”