A complete image of the helical arrangement of cellulose ®brils in the S2 layer of adjacent wood cells of Picea abies (Norwegian spruce) was obtained by applying position-resolved synchrotron X-ray microdiffraction on cells in cross section. In contrast to conventional ®ber diffraction studies, the incident beam was parallel to the longitudinal cell axis, resulting in a glancing angle " far from 90 with respect to the cellulose ®brils. This special choice of diffraction geometry allowed us to take advantage of an asymmetry effect in the two-dimensional diffraction patterns arising from the curvature of the Ewald sphere to obtain information on the local orientation of the cellulose ®brils. The small size of the beam, smaller than the thickness of a single cell wall, allowed mesh scans over intact transverse sections of adjacent wood cells with a microscopic position resolution. The scan yielded a map of diffraction patterns that could readily serve as a microscopic image. Each of the diffraction patterns was then used to evaluate the local orientation of the cellulose ®brils at the actual beam position. The combination of these results gave an image of cellulose ®brils forming (Z) helices in several adjacent wood cells.