This paper presents a novel detection technique for inspecting solar cells micro cracks. Initially, the solar cell is captured using Electroluminescence (EL) method, then processed by the proposed technique. The technique consist of three stages, the first stage combines two images, the first image is the crackfree (healthy) solar cell, whereas the second is the cracked solar cell image. Both output images processed into a bit-by-bit gridding technique, which enables the detection of all bits in the considered area of the cracked solar cell. The second stage uses an OR gate between each of the examined bits for both healthy and cracked solar cells. The final calibrated image presents a high quality, and low noise structure, thus easier to identify the micro crack size, location and its orientation. In order to examine the effectiveness of the proposed technique, three different cracked PV solar cells have been examined. The results show that the micro cracks size, orientation, and location is more visible using the proposed technique. In addition, the developed technique has been validated using a full scale PV module, and compared with up to date available PV micro crack detection methods.