1986
DOI: 10.1007/bf02744138
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SnO2:F films synthesized by chemical vapour deposition technique using hydrofluoric acid as doping material

Abstract: Highly transparent and highly conducting films of SnO2 : F were prepared by chemical vapour deposition technique. The films prepared at 350°C substrate temperature and 2.5 lit. min-~ flow rate of oxygen showed maximum figure of merit. The optimum doping concentration of fluorine was 1.02 wt ~o-The Hall experiment showed that the films prepared at optimum conditions had high carrier concentration and high mobility.

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Cited by 3 publications
(2 citation statements)
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“…In dual-source CVD procedures, one of the tin precursors discussed above [Me 4 Sn, SnCl 4 , SnCl 2 , Sn(NMe 2 ) 4 ] along with either F 2 , 78 NH 4 F, 79,80 HF, 70,81 BrCF 3 69 and other fluorocarbons, 73 or CF 3 CO 2 H 82 as sources of fluorine have been reported. However, the "activity" of the fluorine within the oxide lattice is sometimes variable and dependent on deposition conditions.…”
Section: F-doped Tin Oxidementioning
confidence: 99%
“…In dual-source CVD procedures, one of the tin precursors discussed above [Me 4 Sn, SnCl 4 , SnCl 2 , Sn(NMe 2 ) 4 ] along with either F 2 , 78 NH 4 F, 79,80 HF, 70,81 BrCF 3 69 and other fluorocarbons, 73 or CF 3 CO 2 H 82 as sources of fluorine have been reported. However, the "activity" of the fluorine within the oxide lattice is sometimes variable and dependent on deposition conditions.…”
Section: F-doped Tin Oxidementioning
confidence: 99%
“…The precursor with the N-F bond releases electrophilic uorine species in the solution at low temperature with potential to readily react with the metal oxides. Other solution processes include corrosive precursors such as HF 33 and NH 4 F 34 that etch the oxides or even the less reactive NaF precursor, 35 which acts as a growth-directing agent, and the uorine content is nontraceable in the SnO 2 lattice. 36,37 The F-TEDA precursor provides a highly reactive yet safe to use method, unlike direct uorination by uorine-containing gases such as (Ar:F 2 ), 38 SF 6 , 39 and CF 4 .…”
Section: Introductionmentioning
confidence: 99%