“…To date, a multitude of techniques have been applied for this purpose including secondary ion mass spectrometry (SIMS) 19,[97][98][99][100] , temperature programmed desorption and reaction 50,52 , laser desorption and ionization 101 , pulsed molecular beam reaction 102 , infrared spectroscopy (FTIR and Raman) 98,103,104 , surface enhanced Raman spectroscopy 103,105 , cavity ringdown spectroscopy 106 , xray photoelectron spectroscopy 35,107 , scanning tunneling microscopy 33,[108][109][110][111] , atomic force microscopy [112][113][114] , and transmission electron microscopy 39 . However, to most accurately characterize surfaces prepared or modified by ion soft landing, it is crucial that the analysis be performed in situ without exposure of the substrate to the environment in the laboratory.…”