2021 International Siberian Conference on Control and Communications (SIBCON) 2021
DOI: 10.1109/sibcon50419.2021.9438923
|View full text |Cite
|
Sign up to set email alerts
|

SOI CMOS, SiGe BiCMOS, GaAs HBT and GaAs PHEMT Technologies Characterization for Radiation-Tolerant Microwave Applications

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
references
References 12 publications
0
0
0
Order By: Relevance