Conference on Lasers and Electro-Optics 2020
DOI: 10.1364/cleo_si.2020.sm2m.2
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Solid-state beam scanner based on VCSEL integrated amplifier with scan resolution of over 200

Abstract: We demonstrate a solid-state beam scanner based on VCSEL-integrated amplifier for 3D sensing. We realized a record beam-steering angle of 16° with 200 resolution points. The integrated chip size is as small as 1 mm.

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