2002
DOI: 10.1140/epjd/e20020024
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Solid-state single photon sources: light collection strategies

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Cited by 155 publications
(123 citation statements)
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“…However, losses can still arise from the sidewall roughness when reducing the pillar diameter. As a result, we expect the coupling to the external field to be given by Z ¼ Q/Q 0, where Q and Q 0 are the quality factors of the pillar mode and the planar cavity, respectively 25 . Figure 1c shows a fit to typical experimentally measured Q/Q 0 for our etching conditions for a planar quality factor of Q 0 ¼ 3,000 (Methods).…”
Section: Resultsmentioning
confidence: 99%
“…However, losses can still arise from the sidewall roughness when reducing the pillar diameter. As a result, we expect the coupling to the external field to be given by Z ¼ Q/Q 0, where Q and Q 0 are the quality factors of the pillar mode and the planar cavity, respectively 25 . Figure 1c shows a fit to typical experimentally measured Q/Q 0 for our etching conditions for a planar quality factor of Q 0 ¼ 3,000 (Methods).…”
Section: Resultsmentioning
confidence: 99%
“…It is possible to fabricate QDs in a GaAs spacer layer, either as high-density ensembles for room temperature operation or as single-emitters at low temperature, that emit at 1.3 μm wavelengths [6], [7]. Another challenge is that QDs emit isotropically and are incorporated in high refractive index materials, which makes efficient photon extraction difficult [8].…”
Section: Introductionmentioning
confidence: 99%
“…In contrast to planar sample structures, for which total internal reflection limits the PEE to less than 1% [23], the microlens design leads to significantly higher PEEs because of its curved surface. However, the device is still suffering from partial reflection at the semiconductor-vacuum interface.…”
Section: Device Fabrication and Experimental Setupmentioning
confidence: 97%