2010
DOI: 10.1007/s10853-010-5026-y
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Solution for the critical thickness models of dislocation generation in epitaxial thin films using the Lambert W function

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Cited by 12 publications
(11 citation statements)
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“…A short overview and description of the currently known approaches for the critical thickness of strained epitaxial films is presented in Ref. 1 and several mathematical models formulated to describe this can be found in Refs. [1][2][3][4][5][6][7][8][9][10][11][12].…”
Section: Introductionmentioning
confidence: 99%
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“…A short overview and description of the currently known approaches for the critical thickness of strained epitaxial films is presented in Ref. 1 and several mathematical models formulated to describe this can be found in Refs. [1][2][3][4][5][6][7][8][9][10][11][12].…”
Section: Introductionmentioning
confidence: 99%
“…Let us describe the problem discussed in this article using the equation for the equilibrium critical thickness obtained by Freund 1,4 in the following form:…”
Section: Introductionmentioning
confidence: 99%
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