2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) 2012
DOI: 10.1109/apeie.2012.6629001
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Some considerations of via stitching impact on parasitic coupling of RF multiports in multilayer packages and MCMs

Abstract: Electromagnetic cavity-resonance modes in parallel-plate planes of power and ground rectangular structures along with parasitic coupling between excitation RF multiports are investigated. Such structures are widely used in microwave multilayer packages, MCMs and could be the source of considerable electromagnetic interference (EMI). Effective methods should be applied for damping and elimination of the radiated fields, especially in small areas and volumes. The investigated three-layered LTCC microwave package… Show more

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