2011
DOI: 10.1016/j.jcrysgro.2010.11.074
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Space arrangement of Ge nanoislands formed by growth of Ge on pit-patterned Si substrates

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Cited by 6 publications
(4 citation statements)
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“…Additionally, we carried out molecular dynamics (MD) studies of Ge surface diffusion on groove‐patterned Si surface with 2 monolayer thick Ge wetting layer. The procedure is described elsewhere . The MD calculations showed that surface activation energy at the sidewalls is 1.15 ± 0.15 eV for inclination angles in the range from 10° to 30°.…”
Section: Resultsmentioning
confidence: 99%
“…Additionally, we carried out molecular dynamics (MD) studies of Ge surface diffusion on groove‐patterned Si surface with 2 monolayer thick Ge wetting layer. The procedure is described elsewhere . The MD calculations showed that surface activation energy at the sidewalls is 1.15 ± 0.15 eV for inclination angles in the range from 10° to 30°.…”
Section: Resultsmentioning
confidence: 99%
“…Experimental studies of CP optimization in the simulation programs of heteroepitaxial growth of quantum dots [1,2] developed in the Institute of Semiconductor Physics, SB RAS have shown that the pattern of memory usage in these programs allows for delta compression relative to the first CP (b = {b i = 1, i ∈ {1, . .…”
Section: Fault-tolerant Parallel Program Implementationmentioning
confidence: 99%
“…Significant results in this field can be obtained by mathematically simulating the heteroepitaxial growth of atoms on pit-patterned substrates. The solution to this problem involves processing of large amounts of information on the structure, properties, and state of the crystal lattice and its elements on high-performance distributed computing systems (CSs) [1,2].…”
Section: Introductionmentioning
confidence: 99%
“…Despite the extensive research of QD growth on pit-patterned substrates, there is a lack of knowledge about the mechanism of their formation and fundamental limitations on the size of the pits, contributing to the spatial ordering [3]. Using the molecular dynamics (MD) method, Novikov et al, [4] have revealed some features of the mechanism of surface atomic diffusion of Ge on pit-patterned Si substrates.…”
Section: Introductionmentioning
confidence: 99%