2007
DOI: 10.1007/s11664-007-0349-4
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Space Charge and Carrier Trapping Effects on the Transient Photocurrents of Organic Materials Using the Time-of-Flight Technique

Abstract: We apply the time-of-flight (TOF) technique to study space charge and carrier trapping effects in the organic materials N,N'-diphenyl-N,N'-bis(3- methylphenyl)-1,1-biphenyl-4,4'-diamine (TPD) and tris(8-hydroxyquinolato) aluminum (Alq3). This is carried out by changing the applied electric field, the laser pulse intensity, and the repetition rate together with environmental conditions in air or in vacuum. We report for the first time, to the best of our knowledge, a clearly nondispersive electron transport in … Show more

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Cited by 25 publications
(12 citation statements)
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“…To understand the charge-carrier transport properties of these HTMs, their hole mobility values (m h )w ere determined from transit times (t T ,F igure S3) using the equation: m = d 2 / Vt T , [43] where d is the organic film thickness and V is the applied voltage. At room temperature, m h of Z33, Z34, and Z35 are 4.67 10 À4 ,7 .46 10 À4 ,a nd 2.76 10 À4 cm 2 V À1 s À1 under the electric field of 1.0 10 5 Vcm À1 ,r espectively.A ll three new HTMsh ave higher m h than pristine spiro-OMeTAD (1.76 10 À4 cm 2 V À1 s À1 at the electric field of 1.0 10 5 Vcm À1 ), which is consistentw ith previouslyr eported data (2 10 À4 cm 2 V À1 s À1 at the electric field of 2.6 10 5 Vcm À1 ).…”
mentioning
confidence: 99%
“…To understand the charge-carrier transport properties of these HTMs, their hole mobility values (m h )w ere determined from transit times (t T ,F igure S3) using the equation: m = d 2 / Vt T , [43] where d is the organic film thickness and V is the applied voltage. At room temperature, m h of Z33, Z34, and Z35 are 4.67 10 À4 ,7 .46 10 À4 ,a nd 2.76 10 À4 cm 2 V À1 s À1 under the electric field of 1.0 10 5 Vcm À1 ,r espectively.A ll three new HTMsh ave higher m h than pristine spiro-OMeTAD (1.76 10 À4 cm 2 V À1 s À1 at the electric field of 1.0 10 5 Vcm À1 ), which is consistentw ith previouslyr eported data (2 10 À4 cm 2 V À1 s À1 at the electric field of 2.6 10 5 Vcm À1 ).…”
mentioning
confidence: 99%
“…An investigation into possible electron deep trapping within the bulk of the materials was carried out by comparing averaged and single pulse photocurrents. A technique known as immobile space charge neutralization15 was used to neutralize the effects of any trapping. This consists of repeated illumination of the sample with grounded electrodes.…”
mentioning
confidence: 99%
“…Noteworthy that ToF is the established electrical measurement used for determining carrier mobility of films [20][21][22][23][24]. electrode charging appeared just after the applied voltage value jumped from 0 V to the target value, and it was followed by carrier injection and succeeding carrier transport.…”
Section: Introductionmentioning
confidence: 99%